Device-level Simulation of the Light-addressable Potentiometric Sensor for High-speed and High-resolution Chemical Imaging

2013 ◽  
Author(s):  
Y. Guo ◽  
K. Miyamoto ◽  
T. Wagner ◽  
M.J. Schöning ◽  
T. Yoshinobu
2012 ◽  
Vol 175 ◽  
pp. 118-122 ◽  
Author(s):  
Carl Frederik Werner ◽  
Torsten Wagner ◽  
Ko-ichiro Miyamoto ◽  
Tatsuo Yoshinobu ◽  
Michael J. Schöning

2011 ◽  
Vol 25 ◽  
pp. 346-349
Author(s):  
Carl Frederik Werner ◽  
Torsten Wagner ◽  
Ko-ichiro Miyamoto ◽  
Tatsuo Yoshinobu ◽  
Michael J. Schöninig

Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.


2021 ◽  
pp. 2001221
Author(s):  
Yun‐Chong Li ◽  
Bo Jiao ◽  
Yi‐Jun Zhang ◽  
Jian Wang ◽  
Wei Ren ◽  
...  

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