Evaluation of Major and Trace Elements Present in Extracted Humic Acid from Bog Peat

The human consumption of humic acid is increasingly relevant therefore the knowledge of exact composition is essential. To make a step in that direction we present gap filling results obtained from three different element analytical investigations of humic acid extracted from fen peat examined in the Carpathian Basin. Prompt-gamma activation (PGAA), neutron activation analytical method (NAA) and X-ray fluorescence (XRF) analysis was carried out. After presenting and explaining the essence of used analytical methods we show some collected spectra and a table where all the concentration of the iden- tified elements are presented with the corresponding measurement errors. All together 42 elements were identified. PACS.78.70.En, 78.70. Nx,78. 90.+t X-ray emission spectra and fluorescence, Neutroninelastic scattering, Other topics in optical properties, condensed matter aspect.

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Major and Trace Elements in the Humic Acid

10.26434/chemrxiv.7122413.v1 ◽

2018 ◽

Author(s):

Zoltán Kis ◽

Katalin Gméling ◽

Tímea Kocsis ◽

János Osán ◽

Mihály András Pocsai ◽

...

Keyword(s):

Trace Elements ◽

Humic Acid ◽

Activation Analysis ◽

Analytical Techniques ◽

Major And Trace Elements ◽

Prompt Gamma Activation Analysis ◽

Prompt Gamma ◽

Gamma Activation ◽

X Ray ◽

Precise Analysis

We present precise analysis of major and trace elements of the humic acid. We used three different element analytical techniques in our investigations as prompt-gamma activation analysis (PGAA), neutron activation analysis (NAA) and X-ray fluorescence (XRF) analysis was carried out. We identified 42 elements in our sample.

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Major and Trace Elements in the Humic Acid

10.26434/chemrxiv.7122413 ◽

2018 ◽

Author(s):

Zoltán Kis ◽

Katalin Gméling ◽

Tímea Kocsis ◽

János Osán ◽

Mihály András Pocsai ◽

...

Keyword(s):

Trace Elements ◽

Humic Acid ◽

Activation Analysis ◽

Analytical Techniques ◽

Major And Trace Elements ◽

Prompt Gamma Activation Analysis ◽

Prompt Gamma ◽

Gamma Activation ◽

X Ray ◽

Precise Analysis

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An Archaeometallurgical Investigation on Metal Samples from the Chiaravalle Cross

Heritage ◽

10.3390/heritage2010055 ◽

2019 ◽

Vol 2 (1) ◽

pp. 836-847 ◽

Cited By ~ 1

Author(s):

Daniela Di Martino ◽

Enrico Perelli Cippo ◽

Antonella Scherillo ◽

Zsolt Kasztovszky ◽

Ildikó Harsányi ◽

...

Keyword(s):

Activation Analysis ◽

Complex Structure ◽

Unknown Origin ◽

Mineralogical Composition ◽

Prompt Gamma Activation Analysis ◽

Prompt Gamma ◽

13Th Century ◽

Gamma Activation ◽

X Ray ◽

Manufacturing Techniques

The production and manufacturing techniques of metals involve expertise, and the study of ancient artifacts relies on interdisciplinary skills. Metalworking processes used in the production of jewelry masterpieces can, for example, give indications on the provenance of an ancient object of an unknown origin and the techniques used. In this regard, metallic samples from the Chiaravalle Cross (a beautiful processional cross with a complex structure, dating to the 13th century) have been studied, combining bulk and point measurements. Neutron-based experiments (like Prompt Gamma Activation Analysis and neutron diffraction) provide the bulk of the elemental and mineralogical composition, while particle induced X-ray emission analyses evidenced important details on its manufacturing techniques.

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Revealing hidden features of a Japanese articulated iron lobster via non-destructive local element analysis and 3D imaging

Journal of Analytical Atomic Spectrometry ◽

10.1039/d1ja00261a ◽

2021 ◽

Author(s):

László Szentmiklósi ◽

Zoltán Kis ◽

Manako Tanaka ◽

Boglárka Maróti ◽

Masato Hoshino ◽

...

Keyword(s):

Activation Analysis ◽

3D Imaging ◽

Prompt Gamma Activation Analysis ◽

Neutron Imaging ◽

Prompt Gamma ◽

Gamma Activation ◽

Element Analysis ◽

X Ray ◽

Local Element ◽

Non Destructive

We present a workflow to non-destructively determine the elemental compositions of internal volumes of interest enclosed within complex-shaped objects, by combining 3D X-ray or neutron imaging, prompt-gamma activation analysis, and...

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Distribution of chlorine in quartz determined by neutron beam focusing prompt gamma activation analysis and micro-x-ray fluorescence

Journal of Materials Research ◽

10.1557/jmr.2003.0346 ◽

2003 ◽

Vol 18 (10) ◽

pp. 2486-2493 ◽

Cited By ~ 3

Author(s):

H. Heather Chen-Mayer ◽

William J. Heward ◽

Rick L. Paul ◽

Frederic J. Klug ◽

Yan Gao

Keyword(s):

Activation Analysis ◽

Analytical Techniques ◽

Prompt Gamma Activation Analysis ◽

Prompt Gamma ◽

Distribution Analysis ◽

Gamma Activation ◽

X Ray ◽

Beam Focusing ◽

Ideal System ◽

Prompt Gamma Activation

This paper describes two spatially resolved analytical techniques for chlorine distribution analysis in high-purity quartz glass. The first, prompt gamma activation analysis (PGAA), to which most of this paper is devoted, is emphasized because a new neutron focusing technique has made this study feasible. Despite the low concentration of chlorine, the neutron absorption cross section for Cl is about 200 times greater than for Si, making Cl in Si an ideal system for PGAA. The second technique described is micro-x-ray fluorescence using a laboratory-based spectrometer. The results from each technique and their ability to quantify low levels of chlorine (400–1800 μg Cl/g SiO2) are described.

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Non-Destructive Characterization of Mechanically Processed Waste Printed Circuit Boards: X-ray Fluorescence Spectroscopy and Prompt Gamma Activation Analysis

Journal of Composites Science ◽

10.3390/jcs3020054 ◽

2019 ◽

Vol 3 (2) ◽

pp. 54 ◽

Cited By ~ 5

Author(s):

Akira Otsuki ◽

Pedro Pereira Gonçalves ◽

Christian Stieghorst ◽

Zsolt Révay

Keyword(s):

Activation Analysis ◽

Printed Circuit Boards ◽

Prompt Gamma Activation Analysis ◽

Prompt Gamma ◽

Circuit Boards ◽

Gamma Activation ◽

X Ray ◽

Printed Circuit ◽

Waste Printed Circuit Boards ◽

Processed Waste

This work aimed to characterize the deportment/concentration and liberation/association of the metals and light elements within mechanically processed waste printed circuit boards (PCBs) that hold the complex and heterogeneous structure and distribution of different material components. Waste PCBs passed through a series of mechanical processing (i.e., comminution and sieving) for metal recovery and were then characterized without further destroying the particles in order to capture their heterogeneity. The characterizations were performed in a laboratory and large-scale neutron facility. The results obtained with a portable X-ray fluorescence spectroscopy and prompt gamma activation analysis were compared and confirmed the good agreement and complementarities in general. The advantages and disadvantages of the two different methods were identified and discussed in this paper, in relation to their application to the analysis of mechanically processed PCB particles.

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Nano-probe x-ray analysis and high-resolution imaging on planar defects in high-pressure synthesized infinite-layer superconductor

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100171377 ◽

1994 ◽

Vol 52 ◽

pp. 728-729

Author(s):

Y. Y. Wang ◽

H. Zhang ◽

V. P. Dravid ◽

H. Zhang ◽

L. D. Marks ◽

...

Keyword(s):

High Pressure ◽

High Resolution ◽

Atomic Structure ◽

Emission Spectra ◽

High Resolution Electron Microscopy ◽

Planar Defects ◽

X Ray ◽

Infinite Layer ◽

Resolution Electron ◽

Resolution Imaging

Azuma et al. observed planar defects in a high pressure synthesized infinitelayer compound (i.e. ACuO2 (A=cation)), which exhibits superconductivity at ~110 K. It was proposed that the defects are cation deficient and that the superconductivity in this material is related to the planar defects. In this report, we present quantitative analysis of the planar defects utilizing nanometer probe xray microanalysis, high resolution electron microscopy, and image simulation to determine the chemical composition and atomic structure of the planar defects. We propose an atomic structure model for the planar defects.Infinite-layer samples with the nominal chemical formula, (Sr1-xCax)yCuO2 (x=0.3; y=0.9,1.0,1.1), were prepared using solid state synthesized low pressure forms of (Sr1-xCax)CuO2 with additions of CuO or (Sr1-xCax)2CuO3, followed by a high pressure treatment.Quantitative x-ray microanalysis, with a 1 nm probe, was performed using a cold field emission gun TEM (Hitachi HF-2000) equipped with an Oxford Pentafet thin-window x-ray detector. The probe was positioned on the planar defects, which has a 0.74 nm width, and x-ray emission spectra from the defects were compared with those obtained from vicinity regions.

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