Research of the Negative Influence of Dimmed LED Luminaires in Context of Smart Installations

This article deals with the investigation of the negative impacts of dimmed public, industrial and office LED (light emitting diode) light installations. This approach is required due to the uncertain design of LED ballasts, while manufacturers do not implement the required PFC (power factor correction) function. Therefore, the focus is on a brief description of the principles of negative influences such as: low power factor, high inrush current and high total harmonic distortion based on direct confrontation with actual standards (IESC EN, NEMA, ENERGY STAR). Further, the behavior of LED drivers is explained under nominal load and dimmed up to critical level. Presented findings confirm issues reported by users from larger installations where LED fittings are dimmed over a certain level. The article includes recommendations for consumers and producers of LED fittings about main issues from the scientific and user points of view. Presented facts conclude on the necessity of studying the marginal operating state of LED fittings aiming at THD (total harmonic distortion), PF (real power factor) and inrush currents.

A combined universal generating function and physics of failure Reliability Prediction Method for an LED driver

The accurate and effective reliability prediction of light emitting diode (LED) drivers has emerged as a key issue in LED applications. However, previous studies have mainly focused on the reliability of electrolytic capacitors or other single components while ignoring circuit topology. In this study, universal generating function (UGF) and physics of failure (PoF) are integrated to predict the reliability of LED drivers. Utilizing PoF, lifetime data for each component are obtained. A system reliability model with multi-phase is established, and system reliability can be predicted using UGF. Illustrated by a two-channel LED driver, the beneficial effects of capacitors and MOSFETs for the reliability of LED drivers is verified. This study (i) provides a universal numerical approach to predict the lifetime of LED drivers considering circuit topology, (ii) enhances the modelling and reliability evaluation of circuits, and (iii) bridges the gap between component and circuit system levels.