In this work, n-ZnO/p-Si heterojunction was investigated using two-dimensional numerical simulation. The effect of Zinc Oxide thickness, carrier concentration in Zinc Oxide layer, minority carrier lifetime of bulk Silicon and the interface states density on electrical properties were studied in dark and under illumination conditions. This study aimed to optimize these parameters in order to obtain n-ZnO/p-Si solar cell with high conversion efficiency and low cost. The simulation was carried out by Atlas silvaco software. As results, a very low saturation current Is, low series resistance Rs, an ideality factor n between 1 and 1.5 were obtained for optimal charge carrier concentrations in the range [5 × 1019–5 × 1021 cm−3] and a thickness of Zinc Oxide between 0.6 and 2 µm. Moreover, a photovoltaic conversion efficiency of 24.75% was achieved without interfacial defect, which decreases to 5.49% for an interface defect density of 5 × 1014 cm−2.