MATHEMATICAL MODEL OF THE INTERACTION OF LOW-ENERGY INERT GAS IONS WITH POLYPROPYLENE IN RADIO-FREQUENCY PLASMA OF LOW PRESSURE

Results of the molecular dynamic simulation of the interaction of low-energy ions (from 10 to 100 eV) with the surface of polypropylene fibrous materials in low pressure radio-frequency (RF) argon plasma is presented. A full-atomic model using the LAMMPS classical molecular dynamics code was made. As a result of numerical calculations, it was found that argon ion bombardment initiates the breaking both of an intermolecular and intramolecular bond of polypropylene with sputtered particles being the hydrocarbon radicals and single atoms. The depth of implantation of the ion is determined, the change in the kinetic energy of the argon atom and the temperature of the simulated cell is obtained.

Comparison of transition rates with the LG (0, 1)* spiral-phase mode field distribution in the frame of three ionization theories

We discussed the tunneling ionization of an Argon atom placed in a strong low-frequency field of Ti: Sapphire laser. The transition rate of the electron obtained with radial polarization LG (0, 1)* spiral-phase mode field distribution included are compared to the basic transition rate. All analyses are given in the frame of the three different ionization theories-Keldysh, PPT, and ADK. We demonstrated that the tunneling transition rate is sensitive to laser polarization and a set field distribution. As well as changes in the azimuthal angle as a parameter on which the given distribution depends.

Soft Ion Sputtering of PAni Studied by XPS, AFM, TOF-SIMS, and STS

Herein is a study of the soft sputtering method, gas cluster ion sputtering (GCIS), and its effects on the atomic, morphologic, and band structure properties of polyaniline (PAni) as studied with X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry, atomic force microscopy, and scanning tunneling spectroscopy (STS). The GCIS source used was a 1000 argon atom cluster with 4 keV energy, which resulted in a sputter yield of 3.4 ± 0.2 × 10−3 nm3 per argon atom. Soft ion sputtering reduced the sample by explicitly removing the oxidized contaminants as determined by surface sensitive techniques: XPS and Time-of-flight secondary ion mass spectrometry (TOF-SIMS). By the use of STS we found that by removing the oxidized components, an overall shift of electronic states occurred, transitioning the states closer to the Fermi edge by 0.3 V.

The collision cross-sections for proton–argon interaction based on ab initio potential

The classical collision cross-sections of a proton with an argon atom as well as the thermal transport coefficients and rate constant of the colliding $\text{H}^{+}-\text{Ar}$ system are evaluated at the kinetic temperature $T\in [100,10\,000]~(\text{K})$ by means of the asymptotically correct analytical potential constructed for the ground $X^{1}\unicode[STIX]{x1D6F4}^{+}$ state of the ArH+ cation from the highly accurate ab initio data available in the entire range of internuclear distances (Terashkevich et al., J. Quant. Spectrosc. Radiat. Transfer, vol. 234, 2019, pp. 139–146). The results can be useful to estimate thermodynamic, transport and kinetic properties of the Ar/H2 plasma in a wide temperature range.