Elucidation of contact state on various rough surfaces via highly robust colorimetric optical interferometry

In this study, we developed and practiced colorimetric optical interferometry for the direct observation of contact states to clarify contact phenomena. We theoretically demonstrated that the effect of roughness diffuse reflection could be neglected using interferometric light intensity according to the relationship between the optical film thickness and hue. Then, we measured the static contact surfaces of spherical test pieces of different root mean square roughnesses. Results indicate that the nominal contact area is significantly larger than that obtained from the Hertzian theory of smooth contact as the surface roughness increases. The contact film thickness on the nominal contact area increases almost in proportion to the root mean square roughness. Our experiment supports the validity of the contact theory and contact simulation with very small roughnesses, which have been difficult to verify experimentally. The advantage of this measurement is that it can simultaneously capture the macroscopic contact area and microscopic film thickness distribution, which is expected to further expand the range of application.

Surveying the Bright Stars by Optical Interferometry. III. A Magnitude-limited Multiplicity Survey of Classical Be Stars

We present the results of a multiplicity survey for a magnitude-limited sample of 31 classical Be stars conducted with the Navy Precision Optical Interferometer and the Mark III Stellar Interferometer. The interferometric observations were used to detect companions in 10 previously known binary systems. For two of these sources (66 Oph and β Cep) new orbital solutions were obtained, while for a third source (υ Sgr) our observations provide the first direct, visual detection of the hot companion to the primary star. Combining our interferometric observations with an extensive literature search, we conclude that an additional four sources (o Cas, 15 Mon, β Lyr, and β Cep) also contain wider binary components that are physical companions to the narrow binaries, thus forming hierarchical multiple systems. Among the sources not previously confirmed as spectroscopic or visual binaries, BK Cam was resolved on a number of nights within a close physical proximity of another star with relative motion possibly suggesting a physical binary. Combining our interferometric observations with an extensive literature search, we provide a detailed listing of companions known around each star in the sample, and discuss the multiplicity frequency in the sample. We also discuss the prospects for future multiplicity studies of classical Be stars by long-baseline optical interferometry.

Curved-Mechanical Characteristic Measurements of Transparent Conductive Film-Coated Polymer Substrates Using Common-Path Optical Interferometry

This study proposes a method for measuring curved-mechanical characteristics based on a whole-folding test for transparent conductive film-coated polymer substrates using common-path optical interferometry. Accordingly, 80-, 160-, and 230-nm indium tin oxide films coated on 40 × 40 mm 125-μm-thick polyethylene terephthalate (PET) substrates, and monolayer graphene films coated on 40 × 40 mm 250-μm-thick PET substrates are inspected and analyzed under the curving conditions of 50-, 30-, 20-, and 10-mm radii before and after an 11,000 whole-folding cycle test based on a 10-mm folding radius. This study utilizes the changes in the phase retardations of transparent conductive film-coated polymer substrates under different curving conditions before and after 11,000 whole-folding cycles to analyze the substrates’ residual stress characteristics that were the direct result of manufacturing process parameters. The results from this study of curved-mechanical characteristic measurements of flexible transparent conductive substrates can provide designers with improved product development and can assist manufacturers in improving the manufacturing design of enhanced coating processes.