Proceedings of 1993 IEEE International SOI Conference
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75

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Electron trapping in SIMOX with supplemental implant

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344587 ◽

2002 ◽

Author(s):

R.J. Lambert ◽

T.N. Bhar ◽

H.L. Hughes

Keyword(s):

Electron Trapping

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High dose response of as-grown SIMOX substrates

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344596 ◽

2002 ◽

Author(s):

O. Flament ◽

P. Paillet ◽

D. Herve ◽

O. Musseau ◽

J.L. Leray ◽

...

Keyword(s):

Dose Response ◽

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Inversion electron effective mobility in SOI NMOSFETs

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344567 ◽

2002 ◽

Author(s):

M.J. Sherony ◽

L.T. Su ◽

J.E. Chung ◽

D.A. Antoniadis

Keyword(s):

Effective Mobility

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Crystallographic effects in implantation of oxygen for SIMOX

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344599 ◽

2002 ◽

Author(s):

M.J. Anc ◽

B.F. Cordts ◽

L.P. Allen ◽

W.A. Krull ◽

M.A. Guerra

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Annealing characteristics of radiation induced leakage in SOS MOSFETs

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344580 ◽

2002 ◽

Author(s):

E.Y. Chao ◽

C. Hu ◽

S. Wu ◽

G.P. Li ◽

P. Liu ◽

...

Keyword(s):

Radiation Induced

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Non-local modeling of impact ionization for optimal device/circuit design in fully depleted SOI CMOS technology

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344570 ◽

2002 ◽

Author(s):

S. Krishnan ◽

J.G. Fossum

Keyword(s):

Circuit Design ◽

Impact Ionization ◽

Cmos Technology ◽

Fully Depleted ◽

Local Modeling ◽

Non Local ◽

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Photo-injection studies of buried oxide layers in SIMOX and BESOI structures

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344608 ◽

2002 ◽

Author(s):

A.G. Revesz ◽

V.V. Afanas'ev ◽

H.L. Hughes

Keyword(s):

Oxide Layers ◽

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Silicon on diamond heat sinks by bonding and etch back

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344593 ◽

2002 ◽

Author(s):

A. Soderbarg ◽

B. Edholm ◽

J. Olsson ◽

S. Tiensuu ◽

E. Johansson

Keyword(s):

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An AFM study of surface morphology of commercial 6" SOI wafers

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344548 ◽

2002 ◽

Author(s):

T.R. Neal ◽

P.C. Karulkar

Keyword(s):

Surface Morphology

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Measurement of minority carrier diffusion length and lifetime in SOI devices by flying spot laser scanner as a function of residual misfit

Proceedings of 1993 IEEE International SOI Conference ◽

10.1109/soi.1993.344600 ◽

2002 ◽

Author(s):

H. Baumgart ◽

R. Egloff ◽

E. Arnold ◽

T.J. Letavic ◽

S. Merchant ◽

...

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Laser Scanner ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Soi Devices ◽

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