2009 IEEE Workshop on Microelectronics and Electron Devices
Latest Publications

TOTAL DOCUMENTS

34

(FIVE YEARS 0)

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4

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Published By IEEE

9781424435517

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Intrinsic Mechanism of Drain-Lag and Current Collapse in GaN-Based HEMTs

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816142 ◽

2009 ◽

Author(s):

W. D. Hu ◽

X. S. Chen ◽

W. Lu

Keyword(s):

Current Collapse ◽

Intrinsic Mechanism ◽

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3D Simulation Study of Cell-Cell Interference in Advanced NAND Flash Memory

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816143 ◽

2009 ◽

Author(s):

Haitao Liu ◽

Steve Groothuis ◽

Chandra Mouli ◽

Jian Li ◽

Krishna Parat ◽

...

Keyword(s):

Simulation Study ◽

Flash Memory ◽

3D Simulation ◽

Nand Flash Memory ◽

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A Self-Adaptive and PVT Insensitive Clock Distribution Network Design for High-Speed Memory Interfaces

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816147 ◽

2009 ◽

Author(s):

Feng Lin ◽

Brent Keeth

Keyword(s):

Network Design ◽

Distribution Network ◽

Clock Distribution ◽

Distribution Network Design ◽

Clock Distribution Network ◽

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EOT, Workfunction, and Vfb Roll-Off in HfO2/Metal Gate Stacks

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816138 ◽

2009 ◽

Author(s):

Jaydeb Goswami ◽

Allen McTeer

Keyword(s):

Gate Stacks ◽

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Analysis and Optimization of Packaging Structures to Maximize the Thermal Performance of Multi-Finger GaInP/GaAs Collector-Up HBTs

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816140 ◽

2009 ◽

Author(s):

Hsien-Cheng Tseng ◽

Jhin-Yuan Chen

Keyword(s):

Thermal Performance

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Integration of IC Industry Feature Sizes with University Back-End-of-Line Post Processing: Example Using a Phase-Change Memory Test Chip

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816141 ◽

2009 ◽

Author(s):

Jennifer Regner ◽

M. Balasubramanian ◽

Beth Cook ◽

Yingting Li ◽

Hiwot Kassayebetre ◽

...

Keyword(s):

Phase Change ◽

Phase Change Memory ◽

Memory Test ◽

Post Processing ◽

Test Chip ◽

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Reference Voltage Generation for Single-Ended Memory Interfaces

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816150 ◽

2009 ◽

Author(s):

Timothy M. Hollis ◽

Dragos Dimitriu

Keyword(s):

Reference Voltage ◽

Voltage Generation ◽

Reference Voltage Generation

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Flexfet Independently-Double-Gated CMOS for Dynamic Circuit Control

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816151 ◽

2009 ◽

Author(s):

Brian Meek ◽

Dale G. Wilson

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A Current-Efficient, Low-Dropout Regulator with Improved Load Regulation

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816154 ◽

2009 ◽

Author(s):

Luis Gutierrez ◽

Elkim Roa ◽

Hugo Hernandez

Keyword(s):

Load Regulation ◽

Low Dropout Regulator ◽

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W-2W Current Steering DAC for Programming Phase Change Memory

2009 IEEE Workshop on Microelectronics and Electron Devices ◽

10.1109/wmed.2009.4816148 ◽

2009 ◽

Author(s):

Shantanu Gupta ◽

Vishal Saxena ◽

Kristy A. Campbell ◽

R. Jacob Baker

Keyword(s):

Phase Change ◽

Phase Change Memory ◽

Current Steering ◽

Current Steering Dac ◽

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