ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization
Journal of Electronic Testing
◽
10.1007/s10836-021-05975-9
◽
2021
◽
Author(s):
Muralidharan Jayabalan
◽
E. Srinivas
◽
Francis H. Shajin
◽
P. Rajesh
Keyword(s):
Test Data
◽
Data Volume
Download Full-text
Related Documents
Cited By
References
Scan test data volume reduction in multi-clocked designs with safe capture technique
Proceedings. International Test Conference
◽
10.1109/test.2002.1041755
◽
2003
◽
Cited By ~ 22
Author(s):
V. Jain
◽
J. Waicukauski
Keyword(s):
Test Data
◽
Volume Reduction
◽
Scan Test
◽
Data Volume
◽
Capture Technique
Download Full-text
Input Test Data Volume Reduction Using Seed Complementation and Multiple LFSRs
2020 IEEE 38th VLSI Test Symposium (VTS)
◽
10.1109/vts48691.2020.9107617
◽
2020
◽
Author(s):
Irith Pomeranz
Keyword(s):
Test Data
◽
Volume Reduction
◽
Data Volume
◽
Input Test
Download Full-text
A Unified Approach to Test Generation and Test Data Volume Reduction
2006 IEEE International Test Conference
◽
10.1109/test.2006.297644
◽
2006
◽
Cited By ~ 3
Author(s):
Yung-chieh Lin
◽
Kwang-ting Cheng
Keyword(s):
Test Data
◽
Test Generation
◽
Volume Reduction
◽
Unified Approach
◽
Data Volume
Download Full-text
Low power Illinois scan architecture for simultaneous power and test data volume reduction
2008 Design, Automation and Test in Europe
◽
10.1145/1403375.1403486
◽
2008
◽
Cited By ~ 11
Author(s):
Anshuman Chandra
◽
Felix Ng
◽
Rohit Kapur
Keyword(s):
Low Power
◽
Test Data
◽
Volume Reduction
◽
Data Volume
Download Full-text
Low Power Test-Compression for High Test-Quality and Low Test-Data Volume
2011 Asian Test Symposium
◽
10.1109/ats.2011.75
◽
2011
◽
Cited By ~ 6
Author(s):
Vasileios Tenentes
◽
Xrysovalantis Kavousianos
Keyword(s):
Low Power
◽
Test Data
◽
Test Quality
◽
Power Test
◽
Test Compression
◽
Low Power Test
◽
Data Volume
◽
High Test
Download Full-text
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
IEICE Transactions on Information and Systems
◽
10.1587/transinf.e92.d.1462
◽
2009
◽
Vol E92-D
(7)
◽
pp. 1462-1465
◽
Cited By ~ 2
Author(s):
Yongjoon KIM
◽
Myung-Hoon YANG
◽
Jaeseok PARK
◽
Eunsei PARK
◽
Sungho KANG
Keyword(s):
Test Data
◽
Application Time
◽
Test Application Time
◽
Test Application
◽
Data Volume
Download Full-text
Efficient space/time compression to reduce test data volume and testing time for IP cores
18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
◽
10.1109/icvd.2005.87
◽
2005
◽
Cited By ~ 14
Author(s):
Lei Li
◽
K. Chakrabarty
◽
S. Kajihara
◽
S. Swaminathan
Keyword(s):
Test Data
◽
Space Time
◽
Testing Time
◽
Time Compression
◽
Data Volume
◽
Ip Cores
Download Full-text
On Utilizing Test Cube Properties to Reduce Test Data Volume Further
2012 IEEE 21st Asian Test Symposium
◽
10.1109/ats.2012.41
◽
2012
◽
Cited By ~ 21
Author(s):
Xijiang Lin
◽
Jansuz Rajski
Keyword(s):
Test Data
◽
Data Volume
Download Full-text
An on-chip combinational decompressor for reducing test data volume
2006 IEEE International Conference on Acoustics Speed and Signal Processing Proceedings
◽
10.1109/iscas.2006.1692871
◽
2006
◽
Author(s):
Jie Don
◽
Yu Hu
◽
Yinhe Han
◽
Xiaowei Li
Keyword(s):
Test Data
◽
Data Volume
◽
On Chip
Download Full-text
Progressive random access scan: a simultaneous solution to test power, test data volume and test time
IEEE International Conference on Test, 2005.
◽
10.1109/test.2005.1583994
◽
2006
◽
Cited By ~ 1
Author(s):
Dong Hyun Baik
◽
K.K. Saluja
Keyword(s):
Test Data
◽
Random Access
◽
Test Time
◽
Simultaneous Solution
◽
Test Power
◽
Power Test
◽
Data Volume
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close