Multilayer Metal‐Oxide Memristive Device with Stabilized Resistive Switching

2019 ◽  
Vol 5 (1) ◽  
pp. 1900607 ◽  
Author(s):  
Alexey Mikhaylov ◽  
Alexey Belov ◽  
Dmitry Korolev ◽  
Ivan Antonov ◽  
Valentina Kotomina ◽  
...  
2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Spyros Stathopoulos ◽  
Ioulia Tzouvadaki ◽  
Themis Prodromakis

AbstractThere is an increasing interest for alternative ways to program memristive devices to arbitrary resistive levels. Among them, light-controlled programming approach, where optical input is used to improve or to promote the resistive switching, has drawn particular attention. Here, we present a straight-forward method to induce resistive switching to a memristive device, introducing a new version of a metal-oxide memristive architecture coupled with a UV-sensitive hybrid top electrode obtained through direct surface treatment with PEDOT:PSS of an established resistive random access memory platform. UV-illumination ultimately results to resistive switching, without involving any additional stimulation, and a relation between the switching magnitude and the applied wavelength is depicted. Overall, the system and method presented showcase a promising proof-of-concept for granting an exclusively light-triggered resistive switching to memristive devices irrespectively of the structure and materials comprising their main core, and, in perspective can be considered for functional integrations optical-induced sensing.


2021 ◽  
Vol 143 ◽  
pp. 110549
Author(s):  
Yuriy Gerasimov ◽  
Evgenii Zykov ◽  
Nikita Prudnikov ◽  
Max Talanov ◽  
Alexander Toschev ◽  
...  

2021 ◽  
Vol 144 ◽  
pp. 110723
Author(s):  
A.N. Mikhaylov ◽  
D.V. Guseinov ◽  
A.I. Belov ◽  
D.S. Korolev ◽  
V.A. Shishmakova ◽  
...  

2011 ◽  
Vol 1292 ◽  
Author(s):  
Jung Won Seo ◽  
Seung Jae Baik ◽  
Sang Jung Kang ◽  
Koeng Su Lim

ABSTRACTThis report covers the resistive switching characteristics of cross-bar type semi-transparent (or see-through) resistive random access memory (RRAM) devices based on ZnO. In order to evaluate the transmittance of the devices, we designed the memory array with various electrode sizes and spaces between the electrodes. To prevent read disturbance problems due to sneak currents, we employed a metal oxide based p-NiO/n-ZnO diode structure, which exhibited good rectifying characteristics and high forward current density. Based on these results, we found that the combined metal oxide diode/RRAM device could be promising candidate with suppressed read disturbances of cross-bar type ZnO RRAM device.


Hyomen Kagaku ◽  
2011 ◽  
Vol 32 (7) ◽  
pp. 422-427
Author(s):  
Takatoshi YODA ◽  
Kentaro KINOSHITA ◽  
Kazufumi DOBASHI ◽  
Kenichi KITAMURA ◽  
Satoru KISHIDA

2010 ◽  
Vol 44 (2) ◽  
pp. 025103 ◽  
Author(s):  
Henrique L Gomes ◽  
Paulo R F Rocha ◽  
Asal Kiazadeh ◽  
Dago M De Leeuw ◽  
Stefan C J Meskers

2011 ◽  
Vol 102 (4) ◽  
pp. 991-996 ◽  
Author(s):  
Lifeng Liu ◽  
Bing Chen ◽  
Bin Gao ◽  
Feifei Zhang ◽  
Yuansha Chen ◽  
...  

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Muhammad Muqeet Rehman ◽  
Ghayas Uddin Siddiqui ◽  
Jahan Zeb Gul ◽  
Soo-Wan Kim ◽  
Jong Hwan Lim ◽  
...  

2015 ◽  
Vol 1 (8) ◽  
pp. 1500061 ◽  
Author(s):  
Jian-Shiou Huang ◽  
Yung-Chang Lin ◽  
Hung-Wei Tsai ◽  
Wen-Chun Yen ◽  
Chia-Wei Chen ◽  
...  

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