High‐Performance Organic Field‐Effect Transistor with Matching Energy‐Band Alignment between Organic Semiconductor and the Charge‐Trapping Dielectric

2019 ◽  
Vol 5 (5) ◽  
pp. 1800865 ◽  
Author(s):  
Yiru Wang ◽  
Youbin Yang ◽  
Ping Ding ◽  
Qi Wei ◽  
Xu Gao ◽  
...  
Keyword(s):  
Organic Semiconductor ◽  
Energy Band ◽  
Field Effect ◽  
High Performance ◽  
Field Effect Transistor ◽  
Charge Trapping ◽  
Band Alignment ◽  
Organic Field Effect Transistor ◽  
Effect Transistor

scholarly journals High Performance Drain Engineered InGaN Heterostructure Tunnel Field Effect Transistor

Micromachines ◽  
2019 ◽  
Vol 10 (1) ◽  
pp. 75 ◽  
Author(s):  
Xiaoling Duan ◽  
Jincheng Zhang ◽  
Jiabo Chen ◽  
Tao Zhang ◽  
Jiaduo Zhu ◽  
...  
Keyword(s):  
Energy Band ◽  
Field Effect ◽  
High Performance ◽  
Field Effect Transistor ◽  
Energy Band Structure ◽  
Drain Region ◽  
Effect Transistor ◽  
Tunnel Field Effect Transistor ◽  
Silvaco Atlas ◽  
Channel Region

A drain engineered InGaN heterostructure tunnel field effect transistor (TFET) is proposed and investigated by Silvaco Atlas simulation. This structure uses an additional metal on the drain region to modulate the energy band near the drain/channel interface in the drain regions, and increase the tunneling barrier for the flow of holes from the conduction band of the drain to the valence band of the channel region under negative gate bias for n-TFET, which induces the ambipolar current being reduced from 1.93 × 10−8 to 1.46 × 10−11 A/μm. In addition, polar InGaN heterostructure TFET having a polarization effect can adjust the energy band structure and achieve steep interband tunneling. The average subthreshold swing of the polar drain engineered heterostructure TFET (DE-HTFET) is reduced by 53.3% compared to that of the nonpolar DE-HTFET. Furthermore, ION increases 100% from 137 mA/mm of nonpolar DE-HTFET to 274 mA/mm of polar DE-HTFET.

Organic field-effect transistor floating-gate memory using polysilicon as charge trapping layer

2019 ◽  
Vol 28 (8) ◽  
pp. 086801 ◽  
Author(s):  
Wen-Ting Zhang ◽  
Fen-Xia Wang ◽  
Yu-Miao Li ◽  
Xiao-Xing Guo ◽  
Jian-Hong Yang
Keyword(s):  
Field Effect ◽  
Field Effect Transistor ◽  
Charge Trapping ◽  
Floating Gate ◽  
Organic Field Effect Transistor ◽  
Floating Gate Memory ◽  
Effect Transistor
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