scholarly journals Trapped Carrier Scattering and Charge Transport in High‐Mobility Amorphous Metal Oxide Thin‐Film Transistors

2018 ◽  
Vol 530 (12) ◽  
pp. 1800341 ◽  
Author(s):  
Xiao Wang ◽  
Ananth Dodabalapur
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Charge Transport ◽  
Thin Film Transistors ◽  
High Mobility ◽  
Amorphous Metal ◽  
Oxide Thin Film ◽  
Carrier Scattering ◽  
Metal Oxide Thin Film ◽  
Amorphous Metal Oxide

Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors

2018 ◽  
Vol 10 (31) ◽  
pp. 25866-25870 ◽  
Author(s):  
Hong-Chih Chen ◽  
Ting-Chang Chang ◽  
Wei-Chih Lai ◽  
Guan-Fu Chen ◽  
Bo-Wei Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Amorphous Metal ◽  
Oxide Thin Film ◽  
Metal Oxide Thin Film ◽  
Amorphous Metal Oxide

Solution-Processed Rad-Hard Amorphous Metal-Oxide Thin-Film Transistors

2018 ◽  
Vol 28 (47) ◽  
pp. 1802717 ◽  
Author(s):  
Byungkyu Park ◽  
Dongil Ho ◽  
Guhyun Kwon ◽  
Dojeon Kim ◽  
Sung Yong Seo ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Amorphous Metal ◽  
Oxide Thin Film ◽  
Solution Processed ◽  
Metal Oxide Thin Film ◽  
Amorphous Metal Oxide

scholarly journals Frequency-Stable Ionic-Type Hybrid Gate Dielectrics for High Mobility Solution-Processed Metal-Oxide Thin-Film Transistors

Materials ◽  
2017 ◽  
Vol 10 (6) ◽  
pp. 612 ◽  
Author(s):  
Jae Heo ◽  
Seungbeom Choi ◽  
Jeong-Wan Jo ◽  
Jingu Kang ◽  
Ho-Hyun Park ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Gate Dielectrics ◽  
High Mobility ◽  
Oxide Thin Film ◽  
Solution Processed ◽  
Metal Oxide Thin Film ◽  
Mobility Solution

The effect of nitrous oxide plasma treatment on the bias temperature stress of metal oxide thin film transistors with high mobility

2015 ◽  
Vol 103 ◽  
pp. 173-177 ◽  
Author(s):  
Wei-Hao Tseng ◽  
Shao-Wei Fang ◽  
Chia-Yang Lu ◽  
Hung-Yang Chuang ◽  
Fan-Wei Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
Nitrous Oxide ◽  
Metal Oxide ◽  
Plasma Treatment ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
High Mobility ◽  
Oxide Thin Film ◽  
Metal Oxide Thin Film ◽  
Bias Temperature Stress
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