InGaAsP quaternary layers on InP (100) substrate analysed by ion backscattering and channeling
1989 ◽
Vol 24
(3)
◽
pp. 331-339
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Keyword(s):
1979 ◽
Vol 160
(2)
◽
pp. 301-311
◽
Keyword(s):
Investigation of Surface Topography of Oxygen on Nickel Single Crystals by Helium Ion Backscattering
1972 ◽
Vol 9
(2)
◽
pp. 620-623
◽
Keyword(s):