Ion backscattering study of ultra-thin oxides: Al2O3 and AlHfOx films on Si
2005 ◽
Vol 241
(1-4)
◽
pp. 377-381
◽
Keyword(s):
1979 ◽
Vol 160
(2)
◽
pp. 301-311
◽
Keyword(s):
Investigation of Surface Topography of Oxygen on Nickel Single Crystals by Helium Ion Backscattering
1972 ◽
Vol 9
(2)
◽
pp. 620-623
◽
1989 ◽
Vol 24
(3)
◽
pp. 331-339
◽
Keyword(s):
Keyword(s):