A reliability assessment method for software products in operational phase?proposal of an accelerated life testing model

2001 ◽  
Vol 84 (8) ◽  
pp. 25-33 ◽  
Author(s):  
Hiroyuki Okamura ◽  
Tadashi Dohi ◽  
Shunji Osaki
Keyword(s):  
Reliability Assessment ◽  
Assessment Method ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Testing Model ◽  
Software Products ◽  
Accelerated Life ◽  
Operational Phase

A Sequential Accelerated Life Testing Framework for System Reliability Assessment With Untestable Components

2018 ◽  
Vol 140 (10) ◽  
Author(s):  
Zhen Hu ◽  
Zissimos P. Mourelatos
Keyword(s):  
System Reliability ◽  
Reliability Assessment ◽  
Reliability Evaluation ◽  
Accelerated Life Testing ◽  
System Level ◽  
Life Testing ◽  
Component Level ◽  
Accelerated Life ◽  
Design Cycle ◽  
Framework System

Testing of components at higher-than-nominal stress level provides an effective way of reducing the required testing effort for system reliability assessment. Due to various reasons, not all components are directly testable in practice. The missing information of untestable components poses significant challenges to the accurate evaluation of system reliability. This paper proposes a sequential accelerated life testing (SALT) design framework for system reliability assessment of systems with untestable components. In the proposed framework, system-level tests are employed in conjunction with component-level tests to effectively reduce the uncertainty in the system reliability evaluation. To minimize the number of system-level tests, which are much more expensive than the component-level tests, the accelerated life testing (ALT) design is performed sequentially. In each design cycle, testing resources are allocated to component-level or system-level tests according to the uncertainty analysis from system reliability evaluation. The component-level or system-level testing information obtained from the optimized testing plans is then aggregated to obtain the overall system reliability estimate using Bayesian methods. The aggregation of component-level and system-level testing information allows for an effective uncertainty reduction in the system reliability evaluation. Results of two numerical examples demonstrate the effectiveness of the proposed method.

scholarly journals Reliability Assessment of a Packaging Automatic Machine by Accelerated Life Testing Approach

2017 ◽  
Vol 11 ◽  
pp. 2178-2186 ◽  
Author(s):  
Alberto Regattieri ◽  
Francesco Piana ◽  
Mauro Gamberi ◽  
Francesco Gabriele Galizia ◽  
Andrea Casto
Keyword(s):  
Reliability Assessment ◽  
Automatic Machine ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Accelerated Life ◽  
Testing Approach

scholarly journals ACCELERATED LIFE TESTING WITH AN UNDERLYING THREE-PARAMETER WEIBULL MODEL

Engevista ◽  
2010 ◽  
Vol 7 (1) ◽  
Author(s):  
Daniel I. de Souza Jr. ◽  
Kamalesh Somani
Keyword(s):  
High Stress ◽  
Linear Acceleration ◽  
Weibull Model ◽  
Test Sample ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Distribution Models ◽  
Testing Model ◽  
Failure Data ◽  
Accelerated Life

The main objective of life testing is to obtain information concerning failure. This information should then be used in order to quantify reliability, improve product reliability, and to determine whether safety and reliability goals are being met. The amount of time available for testing directly at use conditions, that is, with practical test times and realistic (relatively) small test sample sizes, could be considerably less than the component’s expected lifetime. To overcome such a problem, there is the life-testing alternative aimed at forcing components to fail by testing them at much higher than the intended application conditions. By doing this, we will get failure data that can be fitted to life distribution models. To go from the failure rate obtained at high stress to what a product or service is likely to experience at much lower stress, under use conditions, we will need additional modeling. These models are known as acceleration models. The accelerated life testing concept is such that a component, operating under predetermined (correct) levels of increased stress, will have exactly the same failure mechanism as observed when used at normal stress levels. For example, if the time of testing is measured in cycles, then the time squeezing may only require increasing the number of cycles per unit of time. In this study, we will develop an accelerated life-testing model in which the underlying sampling distribution is the three-parameter Weibull model. We will be assuming a linear acceleration condition. An example will illustrate the application of the proposed accelerated life-testing model.  

Reliability Assessment of Passives for 300C using HALT

2010 ◽  
Vol 2010 (HITEC) ◽  
pp. 000199-000206
Author(s):  
David Shaddock ◽  
Vinayak Tilak ◽  
Tan Zhang ◽  
Rui Zhang ◽  
R. Wayne Johnson
Keyword(s):  
Ambient Temperature ◽  
Reliability Assessment ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Passive Components ◽  
Test Methodology ◽  
Combined Stresses ◽  
Accelerated Life

Highly accelerated life testing (HALT) is used to quickly assess the reliability of passive components for geothermal applications operating at 300°C ambient temperature. The HALT methodology uses combined stresses to accelerate the failure of capacitors and resistors. This paper describes the test methodology, special fixture designed, and results on capacitors and resistors. Life models for the components are presented. A process to modify component terminations is presented to make them appropriate for 300°C.

Accelerated Life Testing Model of Laser Diodes under Space Radiation Stress

2014 ◽  
Vol 41 (5) ◽  
pp. 0502001
Author(s):  
刘韵 Liu Yun ◽  
赵尚弘 Zhao Shanghong ◽  
杨生胜 Yang Shengsheng ◽  
李勇军 Li Yongjun ◽  
强若馨 Qiang Ruoxin
Keyword(s):  
Laser Diodes ◽  
Space Radiation ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Radiation Stress ◽  
Testing Model ◽  
Accelerated Life

A Software Accelerated Life Testing Model

2010 ◽  
Author(s):  
Toshiya Fujii ◽  
Tadashi Dohi ◽  
Hiroyuki Okamura ◽  
Takaji Fujiwara
Keyword(s):  
Accelerated Life Testing ◽  
Life Testing ◽  
Testing Model ◽  
Accelerated Life
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