Changes in superstructure of drawn isotactic polypropylene with annealing: A two-dimensional small-angle x-ray analysis

1984 ◽  
Vol 22 (3) ◽  
pp. 485-500 ◽  
Author(s):  
A. Ferrero Rognoni ◽  
E. Ferracini ◽  
J. Loboda Čačkovi?? ◽  
H. Čačkovi??
Keyword(s):  
Isotactic Polypropylene ◽  
Small Angle ◽  
Two Dimensional ◽  
X Ray

scholarly journals Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale

2013 ◽  
Vol 21 (1) ◽  
pp. 1-4 ◽  
Author(s):  
Hiroyuki Kishimoto ◽  
Yuya Shinohara ◽  
Yoshio Suzuki ◽  
Akihisa Takeuchi ◽  
Naoto Yagi ◽  
...  
Keyword(s):  
Small Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Detector Distance ◽  
Medium Length ◽  
Set Up ◽  
Micrometer Scale ◽  
Ray Scattering

A pinhole-type two-dimensional ultra-small-angle X-ray scattering set-up at a so-called medium-length beamline at SPring-8 is reported. A long sample-to-detector distance, 160.5 m, can be used at this beamline and a small-angle resolution of 0.25 µm−1was thereby achieved at an X-ray energy of 8 keV.

SLADS: a parallel code for direct simulations of scattering of large anisotropic dense nanoparticle systems

2017 ◽  
Vol 50 (3) ◽  
pp. 951-958 ◽  
Author(s):  
Sen Chen ◽  
Juncheng E ◽  
Sheng-Nian Luo
Keyword(s):  
Analytical Solutions ◽  
Small Angle ◽  
Real Space ◽  
Small Angle Scattering ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Parallel Code ◽  
Diffraction Patterns

SLADS(http://www.pims.ac.cn/Resources.html), a parallel code for direct simulations of X-ray scattering of large anisotropic dense nanoparticle systems of arbitrary species and atomic configurations, is presented. Particles can be of arbitrary shapes and dispersities, and interactions between particles are considered. Parallelization is achieved in real space for the sake of memory limitation. The system sizes attempted are up to one billion atoms, and particle concentrations in dense systems up to 0.36. Anisotropy is explored in terms of superlattices. One- and two-dimensional small-angle scattering or diffraction patterns are obtained.SLADSis validated self-consistently or against cases with analytical solutions.

Two-dimensional small-angle X-ray scattering of self-assembled nanocomposite films with oriented arrays of spheres: determination of lattice type, preferred orientation, deformation and imperfection

2007 ◽  
Vol 40 (3) ◽  
pp. 409-417 ◽  
Author(s):  
Wilhelm Ruland ◽  
Bernd M. Smarsly
Keyword(s):  
Small Angle ◽  
Dip Coating ◽  
Preferred Orientation ◽  
Nanocomposite Films ◽  
Two Dimensional ◽  
Colloidal Solutions ◽  
X Ray ◽  
Lattice Type ◽  
X Ray Scattering ◽  
Ray Scattering

Mesostructured oxide films were prepared by dip-coating from colloidal solutions on ultrathin Si wafers and solidified by heating at various temperatures. Two-dimensional small-angle X-ray scattering measurements were carried out in transmission under selected tilt angles and evaluated by comparison with analytical expressions. The films are composed of oriented mesophases, the structures of which are defined in terms of lattice type, preferred orientation, deformation and imperfection, notably stacking faults.

scholarly journals Processing two-dimensional X-ray diffraction and small-angle scattering data inDAWN 2

2017 ◽  
Vol 50 (3) ◽  
pp. 959-966 ◽  
Author(s):  
J. Filik ◽  
A. W. Ashton ◽  
P. C. Y. Chang ◽  
P. A. Chater ◽  
S. J. Day ◽  
...  
Keyword(s):  
Data Processing ◽  
Small Angle ◽  
Scattering Data ◽  
Data Provenance ◽  
Complex Data ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Full Data ◽  
X Ray ◽  
Data Files

A software package for the calibration and processing of powder X-ray diffraction and small-angle X-ray scattering data is presented. It provides a multitude of data processing and visualization tools as well as a command-line scripting interface for on-the-fly processing and the incorporation of complex data treatment tasks. Customizable processing chains permit the execution of many data processing steps to convert a single image or a batch of raw two-dimensional data into meaningful data and one-dimensional diffractograms. The processed data files contain the full data provenance of each process applied to the data. The calibration routines can run automatically even for high energies and also for large detector tilt angles. Some of the functionalities are highlighted by specific use cases.

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