Organic and Inorganic Hybrid-Polymer Thin Films by PECVD Method and Characterization of Their Electrical and Optical Properties

2007 ◽  
Vol 4 (S1) ◽  
pp. S812-S816 ◽  
Author(s):  
In-Seob Bae ◽  
Sang-Jin Cho ◽  
Seong-Hun Jeong ◽  
Hyung Jun Cho ◽  
Byungyou Hong ◽  
...  
2008 ◽  
Vol 516 (11) ◽  
pp. 3577-3581 ◽  
Author(s):  
I.-S. Bae ◽  
S.-J. Cho ◽  
W.-S. Choi ◽  
B.-Y. Hong ◽  
Y.-J. Kim ◽  
...  

2012 ◽  
Vol 13 (8) ◽  
pp. 1463-1469 ◽  
Author(s):  
Luis Cerdán ◽  
Angel Costela ◽  
Inmaculada García-Moreno

1993 ◽  
Vol 8 (12) ◽  
pp. 3131-3134 ◽  
Author(s):  
Yue-Song He ◽  
Joe C. Campbell ◽  
Robert C. Murphy ◽  
M.F. Arendt ◽  
John S. Swinnea

Films of Sb : SnO2 have been formed by vacuum e-beam evaporation. The structural, electrical, and optical properties of these films have been investigated with respect to annealing time and temperature. After heat treatment in an oxygen atmosphere, thin films with a peak transmittance of 98% and 4–9 × 10−3 Ωcm resistivity have been obtained. The barrier heights and energy band diagrams of Sb : SnO2/Si n-n and p-n heterojunctions have been determined by C-V measurements.


2010 ◽  
Vol 17 (03) ◽  
pp. 353-358 ◽  
Author(s):  
SANG-JIN CHO ◽  
SUNGWOO LEE ◽  
DONGGEUN JUNG ◽  
JIN-HYO BOO

We investigated the interaction of varied plasma power with ultralow-κ Toluene–TEOS hybrid plasma-polymer thin films, as well as changes in electrical and mechanical properties with various mixture ratios of toluene and TEOS (tetraethoxysilane). Using the plasma enhanced chemical vapor deposition (PECVD) method, organic–inorganic hybrid polymer thin films were deposited on silicon(100) substrates under 150°C of wall temperature and a ratio of TEOS to toluene. Toluene and TEOS were utilized as organic and inorganic precursors, and hydrogen and argon were used as bubbler and carrier gases, respectively. In order to compare the differences in the electrical and the mechanical properties of plasma polymerized thin films, we grew the hybrid polymer thin films under 30 W of RF (radio frequency using 13.56 MHz) power with various ratios of toluene to TEOS. The as-grown polymerized thin films were first analyzed by Fourier Transform Infrared (FT-IR) spectroscopy, and Atomic Force Microscopy (AFM). The results of FT-IR showed that the hybrid polymer thin films were totally fragmented and polymerized with increasing RF power. AFM showed that polymer films with smooth surface could be grown under various deposition conditions. An impedance analyzer was utilized for the measurements of capacitance values for dielectric constants and the thin films were analyzed for hardness and Young's modulus using a nanoindenter.


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