Structural, optical and electrical properties of nanodiamond films deposited by HFCVD on borosilicate glass, fused silica and silicon at low temperature

2004 ◽  
Vol 201 (11) ◽  
pp. 2499-2502 ◽  
Author(s):  
Z. Remes ◽  
Y. Avigal ◽  
R. Kalish ◽  
C. Uzan-Saguy ◽  
A. Chack ◽  
...  
2014 ◽  
Vol 35 (5) ◽  
pp. 052001 ◽  
Author(s):  
T Namitha Asokan ◽  
K S Urmila ◽  
Rajani Jacob ◽  
Rachel Reena Philip ◽  
G S Okram ◽  
...  

2018 ◽  
Vol 10 (3) ◽  
pp. 88 ◽  
Author(s):  
Aleksandra Wieloszynska ◽  
Robert Bogdanowicz

Thickness is one of the most important parameters in many applications using thin layers. This article describes determination of the thickness of boron-doped nanocrystalline diamond (NCD) grown on fused silica glass. The spectroscopic measurement system has been used. A high refractive index (2.3 @ 550 nm) was achieved for NCD films. The thickness of the NCD samples has been determined from transmission spectrum. Full Text: PDF ReferencesZ. Li, S. Butun, K. Aydin, 'Large-area, lithography-free super absorbers and color filters at visible frequencies using ultrathin metallic films', ACS Photonics, vol. 2.2, pp. 183-188 2015. CrossRef L. Yu, D.D. Tune, C.J. Shearer, J.G. Shapter, 'Implementation of antireflection layers for improved efficiency of carbon nanotube–silicon heterojunction solar cells', Solar Energy, vol. 118, pp. 592-599, 2015. CrossRef D. Majchrowicz, Daria, et al., Nitrogen-Doped Diamond Film for Optical Investigation of Hemoglobin Concentration, Materials, vol. 11.1, pp. 109, 2018. CrossRef K.L. Konnerth, F.H. Dill, 'In-situ measurement of dielectric thickness during etching or developing processes', IEEE Transactions on Electron Devices, vol. 22.7, pp. 452-456, 1975. CrossRef Z.G. Hu, P. Prunici, P. Hess, K.H. Chen, 'Optical properties of nanocrystalline diamond films from mid-infrared to ultraviolet using reflectometry and ellipsometry', Journal of Materials Science: Materials in Electronics, vol. 18.1, pp. 37-41, 2007. CrossRef J. Adamczewska, et al., 'Procesy technologiczne w elektronice półprzewodnikowej', WNT, Warsaw, 1980.J.P. Dilger, L. R. Fisher, D. A. Haydon, 'A critical comparison of electrical and optical methods for bilayer thickness determination', Chemistry and Physics of Lipids, vol. 30.2-3, pp. 159-176, 1982. CrossRef M, Ficek, et al, 'Optical and electrical properties of boron doped diamond thin conductive films deposited on fused silica glass substrates', Applied Surface Science, vol. 387, pp. 846-856, 2016. CrossRef R. Bogdanowicz, et al, 'Opto-Electrochemical Sensing Device Based on Long-Period Grating Coated with Boron-Doped Diamond Thin Film', J. Opt. Soc. Korea, vol. 19, pp. 705-710, 2015. CrossRef M. Sobaszek, et al., 'Optical and electrical properties of ultrathin transparent nanocrystalline boron-doped diamond electrodes', Optical Materials, vol.42, pp. 24-34, 2015. CrossRef R. Bogdanowicz, et al, 'Improved surface coverage of an optical fibre with nanocrystalline diamond by the application of dip-coating seeding', Diamond and Related Materials, vol. 55, pp. 52-63, 2015. CrossRef Z.G. Hu, P. Hess, 'Optical constants and thermo-optic coefficients of nanocrystalline diamond films at 30–500oC', Applied physics letters, vol. 89.8: 081906, 2006. CrossRef


2014 ◽  
Vol 10 (4) ◽  
pp. 869-878 ◽  
Author(s):  
Soaram Kim ◽  
Giwoong Nam ◽  
Hyunsik Yoon ◽  
Hyunggil Park ◽  
Hyonkwang Choi ◽  
...  

2012 ◽  
Vol 33 (11) ◽  
pp. 1232-1235
Author(s):  
李晓妮 LI Xiao-ni ◽  
方芳 FANG Fang ◽  
方铉 FANG Xuan ◽  
陈新颖 CHEN Xin-ying ◽  
魏志鹏 WEI Zhi-peng ◽  
...  

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