Temperature dependence of the quantum efficiency in green light emitting diode dies

2007 ◽  
Vol 4 (7) ◽  
pp. 2784-2787 ◽  
Author(s):  
Y. Li ◽  
W. Zhao ◽  
Y. Xia ◽  
M. Zhu ◽  
J. Senawiratne ◽  
...  
2018 ◽  
Vol 9 (1) ◽  
pp. 77 ◽  
Author(s):  
Muhammad Usman ◽  
Urooj Mushtaq ◽  
Dong-Guang Zheng ◽  
Dong-Pyo Han ◽  
Muhammad Rafiq ◽  
...  

To improve the internal quantum efficiency of green light-emitting diodes, we present the numerical design and analysis of bandgap-engineered W-shaped quantum well. The numerical results suggest significant improvement in the internal quantum efficiency of the proposed W-LED. The improvement is associated with significantly improved hole confinement due to the localization of indium in the active region, leading to improved radiative recombination rate. In addition, the proposed device shows reduced defect-assisted Shockley-Read-Hall (SRH) recombination rate as well as Auger recombination rate. Moreover, the efficiency rolloff in the proposed device is associated with increased built-in electromechanical field.


2019 ◽  
Vol 9 (3) ◽  
pp. 383
Author(s):  
Boyang Lu ◽  
Lai Wang ◽  
Zhibiao Hao ◽  
Yi Luo ◽  
Changzheng Sun ◽  
...  

In this paper, the optical properties of GaN-based green light emitting diode (LED) are investigated and the internal quantum efficiency (IQE) values are measured by temperature dependent photoluminescence (TDPL) and power dependent photoluminescence (PDPL) methods. The "S-shaped” shift of peak wavelength measured at different temperature disappears gradually and the spectra broadening can be observed with increasing excitation power. The IQE calculation results of TDPL, which use the integrated intensity measured at low temperature as unity, can be modified by PDPL in order to acquire more accurate IQE values.


2006 ◽  
Vol 955 ◽  
Author(s):  
Yufeng Li ◽  
Wei Zhao ◽  
Yong Xia ◽  
Mingwei Zhu ◽  
Jayantha Senawiratne ◽  
...  

ABSTRACTThe electroluminescence, photoluminescence and cathodoluminescence of GaInN/GaN multiple quantum well light emitting diode dies are analyzed at variable low temperature. Three dies of nominally identical structure but strongly different RT performance from 510 nm to 525 nm have been studied. The electroluminescence peak energy exhibits a blue shift from RT to 158 K followed by a red shift for lower temperature. In the same low-temperature range, a secondary emission peak appears near 390 nm (3.18 eV) that resembles a donor-acceptor pair transition from GaN. Depth profiling spectroscopy of this transition at 77 K reveals its location either in the unintentionally doped quantum barriers or within the n-GaN layer, rather than the commonly believed Mg doped p-type GaN layers. The external quantum efficiency of each die increases as the temperature is lowered. A maximum is reached for all near 158 K while for lower temperature as low as 7.7 K, the efficiency continuously drops. The pronounced efficiency maximum is tentatively assigned to a combination of temperature dependent mobility and shift of the actual pn-junction location.


2010 ◽  
Vol 3 (5) ◽  
pp. 054001 ◽  
Author(s):  
Ikuo Suemune ◽  
Yujiro Hayashi ◽  
Shuhei Kuramitsu ◽  
Kazunori Tanaka ◽  
Tatsushi Akazaki ◽  
...  

2021 ◽  
Vol 118 (2) ◽  
pp. 021102
Author(s):  
Dong-Pyo Han ◽  
Ryoto Fujiki ◽  
Ryo Takahashi ◽  
Yusuke Ueshima ◽  
Shintaro Ueda ◽  
...  

1992 ◽  
Vol 283 ◽  
Author(s):  
Peter Steiner ◽  
Frank Kozlowski ◽  
Hermann Sandmaier ◽  
Walter Lang

ABSTRACTFirst results on light emitting diodes in porous silicon were reported in 1991. They showed a quantum efficiency of 10-7 to 10-5 and an orange spectrum. Over the last year some progress was achieved:- By applying UV-light during the etching blue and green light emitting diodes in porous silicon are fabricated.- When a p/n junction is realized within the porous region, a quantum efficiency of 10-4 is obtained.


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