Bias temperature instability analysis on memory properties improved by hydrogen annealing treatment in Ti/HfO
x
/Pt capacitors
2013 ◽
Vol 7
(7)
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pp. 497-500
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2019 ◽
Vol 11
(4)
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pp. 04018-1-04018-6
2008 ◽
Vol 55
(7)
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pp. 1630-1638
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