Assessment of Energy Barriers Between ZrCuAlNi Amorphous Metal and Atomic Layer Deposition Insulators Using Internal Photoemission Spectroscopy
2018 ◽
Vol 12
(3)
◽
pp. 1700437
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2018 ◽
Vol 36
(2)
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pp. 02D402
Keyword(s):
In-situX-ray Photoemission Spectroscopy Study of Atomic Layer Deposition of TiO2on Silicon Substrate
2012 ◽
Vol 51
(3R)
◽
pp. 031102
◽
2012 ◽
Vol 51
◽
pp. 031102
◽
2015 ◽
Vol 27
(6)
◽
pp. 1917-1920
◽
Keyword(s):
2018 ◽
Vol 737
◽
pp. 684-692
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Keyword(s):
2016 ◽
Vol 49
(27)
◽
pp. 275304
◽
2011 ◽
Vol 11
(5)
◽
pp. 4328-4332
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