Initial reactions of ultrathin HfO2 films by in situ atomic layer deposition: An in situ synchrotron photoemission spectroscopy study
2018 ◽
Vol 36
(2)
◽
pp. 02D402
Keyword(s):
2011 ◽
Vol 11
(5)
◽
pp. 4328-4332
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In-situX-ray Photoemission Spectroscopy Study of Atomic Layer Deposition of TiO2on Silicon Substrate
2012 ◽
Vol 51
(3R)
◽
pp. 031102
◽
2012 ◽
Vol 51
◽
pp. 031102
◽
2017 ◽
Vol 422
◽
pp. 666-674
◽
2009 ◽
Vol 113
(19)
◽
pp. 8249-8257
◽
Keyword(s):