Stereo‐dependent dimerization, boiling points, diffusion coefficients, and dielectric constants of E/Z‐HFO‐1234ze

Author(s):  
Xiaoyi Hu ◽  
Xiaojuan Yu ◽  
Hua Hou ◽  
Baoshan Wang
1980 ◽  
Vol 58 (14) ◽  
pp. 1490-1494 ◽  
Author(s):  
Norman Gee ◽  
Gordon R. Freeman

The relationship between ion mobility and liquid viscosity is commonly expressed as μ [Formula: see text] η−m. In hydrocarbons the value of m tends to be near 1.0 at η > 5 mP, m > 1.0 at ~5 < η < 1 mP, and m < 1.0 at η < 0.5 mP. Thus there is a maximum in a plot of μη against η−1 and Walden's rule (m = 1.0) is only a rough approximation. The decrease of μη as the critical region is approached is accompanied by an increase in the ratio of diffusion coefficients Dmolec/Dion. Ion mobilities in the liquids well below their normal boiling points are chiefly controlled by the fluidity. At higher temperatures and concomitant lower liquid densities and viscosities μη first increases, due to an increasing ion mean free path, then decreases as the critical region is approached, due to the increasing liquid compressibility and consequent electrostriction about the ion.


1971 ◽  
Vol 49 (11) ◽  
pp. 1965-1967 ◽  
Author(s):  
Harry Watts

The diffusion coefficients in air of 1,1-dichloroethane, 1,1,1-trichloroethane, trichloroethylene, and tetrachloroethylene have been measured over a temperature range from room temperature to close to their boiling points by a rate of evaporation method.


1973 ◽  
Vol 51 (10) ◽  
pp. 1497-1503 ◽  
Author(s):  
Peter Tremaine ◽  
Maurice G. Robinson

The static dielectric constants of CF4, CHF3, CH2F2, and CH3F have been measured at temperatures ranging from their melting points to their normal boiling points. The molar polarization of CF4 agrees with that of the gas phase to within experimental error. The deviation of the dielectric constants of the polar fluoromethanes from the values predicted by the Onsager equation cannot be fully due to their non-spherical shape.It is postulated that although a significant parallel dipole correlation may be present in each fluoromethane, the polarization resulting from the liquid lattice vibrations, may account for much, or all, of the effect in CH3F and CH2F2.


1985 ◽  
Vol 63 (12) ◽  
pp. 3492-3498 ◽  
Author(s):  
M. Chastrette ◽  
J. Carretto

Using multivariational statistical methods, the calculation and interpretation of empirical parameters of the polarity of solvents has been reexamined. The size of the sample used (57 aprotic solvents and 24 protic solvents) assures that it is representative. For each solvent, the data tabulated include some physical constants (dielectric constants, dipole moments, refractive indices, molar refractions, boiling points, Hildebrand's δ parameters) or theoretical values (energy levels of frontier orbitals). The methods used are factorial analysis and multiple regression. The results obtained show that, for the aprotic solvents, the parameter ET is a measure of the polarity, of the polarizability, and of the cohesion of the solvent to the extent of 43, 39, and 18% respectively. For the parameter π*, these proportions are respectively 53, 18, and 29%. For the protic solvents, the parameter ET is explained by the same variables except for 5 solvents more acidic than water; this anomaly is explained by the basicity of the oxygen of the betaine used to define ET.


1989 ◽  
Vol 67 (1) ◽  
pp. 27-31 ◽  
Author(s):  
Norman Gee ◽  
Gordon R. Freeman

The cation mobility μ+ was measured in n-pentane at 295 K and in n-C6 to C11 and n-C14 alkanes from ~295 K to their normal boiling points. The dependence on viscosity [Formula: see text] was reexamined and the best fit occurred with p = 1.0. The ratio of diffusion coefficients of neutral molecules to analogous cations was ~3 because of the stronger interaction of ions with the fluid molecules (electrostriction). The dependence of μ+ on free volume is illustrated. Keywords: thermal cation mobility, n-alkane solvents, viscosity effects


1971 ◽  
Vol 49 (1) ◽  
pp. 67-73 ◽  
Author(s):  
Harry Watts

The diffusion coefficients in air of carbon tetrachloride, chloroform, and methylene chloride have been measured over a temperature range from room temperature to close to their boiling points by a modified rate of evaporation method. It was shown that considerable error can occur in diffusion coefficients determined by the rate of evaporation method when gas imperfections are ignored.


Author(s):  
E.G. Bithell ◽  
W.M. Stobbs

It is well known that the microstructural consequences of the ion implantation of semiconductor heterostructures can be severe: amorphisation of the damaged region is possible, and layer intermixing can result both from the original damage process and from the enhancement of the diffusion coefficients for the constituents of the original composition profile. A very large number of variables are involved (the atomic mass of the target, the mass and energy of the implant species, the flux and the total dose, the substrate temperature etc.) so that experimental data are needed despite the existence of relatively well developed models for the implantation process. A major difficulty is that conventional techniques (e.g. electron energy loss spectroscopy) have inadequate resolution for the quantification of any changes in the composition profile of fine scale multilayers. However we have demonstrated that the measurement of 002 dark field intensities in transmission electron microscope images of GaAs / AlxGa1_xAs heterostructures can allow the measurement of the local Al / Ga ratio.


Author(s):  
V. Kaushik ◽  
P. Maniar ◽  
J. Olowolafe ◽  
R. Jones ◽  
A. Campbell ◽  
...  

Lead zirconium titanate films (Pb (Zr,Ti) O3 or PZT) are being considered for potential application as dielectric films in memory technology due to their high dielectric constants. PZT is a ferroelectric material which shows spontaneous polarizability, reversible under applied electric fields. We report herein some results of TEM studies on thin film capacitor structures containing PZT films with platinum-titanium electrodes.The wafers had a stacked structure consisting of PZT/Pt/Ti/SiO2/Si substrate as shown in Figure 1. Platinum acts as electrode material and titanium is used to overcome the problem of platinum adhesion to the oxide layer. The PZT (0/20/80) films were deposited using a sol-gel method and the structure was annealed at 650°C and 800°C for 30 min in an oxygen ambient. XTEM imaging was done at 200KV with the electron beam parallel to <110> zone axis of silicon.Figure 2 shows the PZT and Pt layers only, since the structure had a tendency to peel off at the Ti-Pt interface during TEM sample preparation.


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