scholarly journals Local dynamic range compensation for scanning electron microscope imaging system by sub-blocking multiple peak HE with convolution

Scanning ◽  
2015 ◽  
Vol 38 (6) ◽  
pp. 492-501 ◽  
Author(s):  
K. S. Sim ◽  
V. Teh ◽  
Y. C. Tey ◽  
T. K. Kho
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