Encoding of stoichiometric constraints in the composition depth profile reconstruction from angle resolved X-ray photoelectron spectroscopy data

Karol Macak

doi:10.1002/sia.3753

Encoding of stoichiometric constraints in the composition depth profile reconstruction from angle resolved X-ray photoelectron spectroscopy data

Surface and Interface Analysis ◽

10.1002/sia.3753 ◽

2011 ◽

Vol 43 (13) ◽

pp. 1581-1604 ◽

Cited By ~ 15

Author(s):

Karol Macak

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Spectroscopy Data ◽

X Ray ◽

Profile Reconstruction ◽

Composition Depth Profile

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Depth profile reconstruction of YCrO3/CaMnO3 superlattices by near total reflection hard x-ray photoelectron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/6.0001113 ◽

2021 ◽

Vol 39 (5) ◽

pp. 053204

Author(s):

Léo Cambou ◽

Jin-Hong Lee ◽

Manuel Bibes ◽

Alexandre Gloter ◽

Jean-Pascal Rueff

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Total Reflection ◽

X Ray ◽

Profile Reconstruction

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Non-destructive depth profile reconstruction of bio-engineered surfaces by parallel-angle-resolved X-ray photoelectron spectroscopy

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-012-6179-0 ◽

2012 ◽

Vol 405 (2-3) ◽

pp. 713-724 ◽

Cited By ~ 7

Author(s):

Rosa Pilolli ◽

Nicoletta Ditaranto ◽

Nicola Cioffi ◽

Luigia Sabbatini

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Engineered Surfaces ◽

Profile Reconstruction ◽

Non Destructive

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Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy

Applied Surface Science ◽

10.1016/j.apsusc.2019.06.083 ◽

2019 ◽

Vol 491 ◽

pp. 16-23 ◽

Cited By ~ 3

Author(s):

J. Zemek ◽

J. Houdkova ◽

P. Jiricek ◽

T. Izak ◽

M. Kalbac

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Single Layer ◽

Single Layer Graphene ◽

X Ray ◽

Layer Graphene ◽

Profile Reconstruction ◽

Non Destructive

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Surface compositions of 9XC and R6M5 tool steels after laser pulse irradiation according to X-ray photoelectron spectroscopy data

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s1027451011050089 ◽

2011 ◽

Vol 5 (3) ◽

pp. 431-439 ◽

Cited By ~ 2

Author(s):

A. T. Kozakov ◽

S. I. Yares’ko ◽

V. I. Kolesnikov ◽

A. V. Sidashov

Keyword(s):

Laser Pulse ◽

Photoelectron Spectroscopy ◽

Spectroscopy Data ◽

Tool Steels ◽

Pulse Irradiation ◽

X Ray

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Chemical bonding and valence state of 3d-metal ions in Ni 1−x Co x Cr 2 O 4 spinels from X-ray diffraction and X-ray photoelectron spectroscopy data

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2014.07.010 ◽

2014 ◽

Vol 195 ◽

pp. 208-219 ◽

Cited By ~ 10

Author(s):

A.G. Kochur ◽

A.T. Kozakov ◽

K.A. Googlev ◽

A.S. Mikheykin ◽

V.I. Torgashev ◽

...

Keyword(s):

Metal Ions ◽

Chemical Bonding ◽

Photoelectron Spectroscopy ◽

Valence State ◽

Spectroscopy Data ◽

X Ray Diffraction ◽

X Ray

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An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

Materials Science in Semiconductor Processing ◽

10.1016/j.mssp.2018.02.022 ◽

2018 ◽

Vol 82 ◽

pp. 62-66 ◽

Cited By ~ 1

Author(s):

Constantin Catalin Negrila ◽

Mihail Florin Lazarescu ◽

Constantin Logofatu ◽

Rodica V. Ghita ◽

Costel Cotirlan

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Gaas Structure ◽

Profile Study

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SIMULATION OF THE ELECTRONIC STRUCTURE OF C(C2H)4 AND Ge(C2H)4 BY THE DENSITY FUNCTIONAL THEORY USING X-RAY PHOTOELECTRON SPECTROSCOPY DATA

Journal of Structural Chemistry ◽

10.1134/s0022476621110044 ◽

2021 ◽

Vol 62 (11) ◽

pp. 1684-1693

Author(s):

M. M. Tatevosyan ◽

T. N. Zhukova ◽

V. G. Vlasenko

Keyword(s):

Density Functional Theory ◽

Electronic Structure ◽

Photoelectron Spectroscopy ◽

Density Functional ◽

Spectroscopy Data ◽

Functional Theory ◽

X Ray ◽

The Density Functional Theory

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Non-destructive initial-profile-free depth profile evaluation of thin-film sample using angle-resolved X-ray photoelectron spectroscopy and profile smoothing regularization

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/ac1fba ◽

2021 ◽

Vol 60 (10) ◽

pp. 101003

Author(s):

Yutaka Hoshina ◽

Kazuya Tokuda ◽

Yoshihiro Saito

Keyword(s):

Thin Film ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Thin Film Sample ◽

Film Sample ◽

Initial Profile ◽

X Ray ◽

Non Destructive

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Deep neural network for x-ray photoelectron spectroscopy data analysis

Machine Learning: Science and Technology ◽

10.1088/2632-2153/ab5da6 ◽

2020 ◽

Vol 1 (1) ◽

pp. 015008 ◽

Cited By ~ 2

Author(s):

G Drera ◽

C M Kropf ◽

L Sangaletti

Keyword(s):

Neural Network ◽

Data Analysis ◽

Photoelectron Spectroscopy ◽

Deep Neural Network ◽

Spectroscopy Data ◽

X Ray

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Study of surface oxidation of polycrystalline rhodium using multivariate analysis based on combined optical microscopy and X-ray photoelectron spectroscopy data

Applied Surface Science ◽

10.1016/j.apsusc.2020.146617 ◽

2020 ◽

Vol 526 ◽

pp. 146617

Author(s):

G. Balcerowska-Czerniak ◽

M. Trzcinski ◽

M. Naparty ◽

A. Bukaluk

Keyword(s):

Multivariate Analysis ◽

Optical Microscopy ◽

Photoelectron Spectroscopy ◽

Surface Oxidation ◽

Spectroscopy Data ◽

X Ray

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