How accurate is the fundamental parameter approach? XRF analysis of bulk and multilayer samples

In the last decade, the Fundamental Parameter (FT) method has been increasingly used in quantitative XRF analysis as an effective means for interelement effect corrections. Many authors have contributed to its continuous development both in theory and practice [1 - 26]. Among various implementations, the FP-alpha method has been used widely in bulk-sample analysis because of its unique advantage of speed [1 - 6]. In recent years, however, with the advent of faster computers, a rigorous full FP approach has become feasible and practical. This is especially true in the field of multilayer thin-film, analysis, where the FP-alpha approach has not yet been applied.

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Examples of Analysis from an Integrated X-Ray Fluorescence Analysis System Using NRLXRF

Advances in X-ray Analysis ◽

10.1154/s0376030800009551 ◽

1981 ◽

Vol 25 ◽

pp. 81-84

Author(s):

B. E. Artz ◽

M. J. Rokosz

Keyword(s):

Energy Dispersive Spectrometer ◽

Fluorescence Analysis ◽

Fundamental Parameter ◽

Analysis Program ◽

X Ray ◽

Fundamental Parameters ◽

Xrf Analysis ◽

Parameters Analysis ◽

Analysis System ◽

Preparation Techniques

Methods of correction for matrix differences are required in X-ray Fluorescence (XRF) Analysis when the overall composition of the unknowns is substantially different from the available standards. Sample preparation techniques used to minimize matrix differences often require development time and can consume irreplaceable sample material. Alternatively, the increasing computer power available to the analyst and the refinement of computer programs using fundamental parameter calculations has made this approach more attractive.A system-consisting of a Siemens SRS-1 wavelength dispersive spectrometer (WDS), a KEVEX 0810-A/NS880 energy dispersive spectrometer (EDS), software for data collection and manipulation and a 40 element version of the NRLXRF fundamental-parameters analysis program has been put together to simplify XRF analysis of samples lacking standards of a similar composition. This configuration is shown schematically in Figure I.

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Wavelength dispersive X-ray fluorescence analysis using fundamental parameter approach of Catha edulis and other related plant samples

Spectrochimica Acta Part B Atomic Spectroscopy ◽

10.1016/j.sab.2012.01.004 ◽

2012 ◽

Vol 67 ◽

pp. 74-78 ◽

Cited By ~ 19

Author(s):

Abdallah A. Shaltout ◽

Mohammed A. Moharram ◽

Nasser Y. Mostafa

Keyword(s):

Fluorescence Analysis ◽

Fundamental Parameter ◽

Catha Edulis ◽

X Ray ◽

Plant Samples ◽

Related Plant ◽

Parameter Approach

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Calculation of Theoretical Alpha Coefficients for XRF Analysis of Major and Minor Elements in Iron-rich Geological Samples

Zeitschrift für Naturforschung A ◽

10.1515/zna-1995-0905 ◽

1995 ◽

Vol 50 (9) ◽

pp. 817-825 ◽

Cited By ~ 1

Author(s):

Younan Hua ◽

C. T. Yap

Keyword(s):

Fluorescence Analysis ◽

Fundamental Parameter ◽

Minor Components ◽

Geological Samples ◽

Standard Samples ◽

X Ray ◽

Xrf Analysis ◽

Minor Elements ◽

On Line ◽

The Given

Abstract This paper introduces a method of calculating theorectical alpha coefficients for the X-ray fluorescence analysis of major and minor components in iron-rich samples. We choose a group of hypothetical standard samples whose average concentrations are those of the actual samples. The theoretical X-ray fluorescence relative intensities of the given components are calculated using the fundamental parameter NRLXRF program. We derived formulas from the Lachance-Traill equation and used these to calculate the basic, hybrid and modified alpha coefficients which are used respectively for the analysis of elements in compact specimens, oxides in compact specimens and oxides in diluted specimens. In order to use the theoretical alpha coefficients on-line, we also discuss the calculation of the alpha coefficients used in the D.J model.

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