Raman Spectroscopy of CVD Carbon Thin Films Excited by Near-Infrared Light

2006 ◽  
pp. 423-445 ◽  
Author(s):  
Margit Koós ◽  
Miklós Veres ◽  
Sára Tóth ◽  
Miklós Füle
2019 ◽  
Vol 39 (1) ◽  
pp. 0131001
Author(s):  
黎志文 Li Zhiwen ◽  
陆华 Lu Hua ◽  
李扬武 Li Yangwu ◽  
焦晗 Jiao Han ◽  
赵建林 Zhao Jianlin

2015 ◽  
Vol 619 ◽  
pp. 800-806 ◽  
Author(s):  
J.L. Clabel H. ◽  
V.A.G. Rivera ◽  
M. Siu Li ◽  
L.A.O. Nunes ◽  
E.R. Leite ◽  
...  

2018 ◽  
Author(s):  
Malgosia Kaczmarek ◽  
Eleni Perivolari ◽  
Jordan Gill ◽  
Nina Podoliak ◽  
Elena Mavrona ◽  
...  

2016 ◽  
Vol 2016 ◽  
pp. 1-12 ◽  
Author(s):  
Li Lin ◽  
Chin-Pao Cheng ◽  
Tun-Ping Teng

In this study, tungsten trioxide (WO3) thin films were electrodeposited on indium tin oxide (ITO) glass to form WO3-coated glass. The electrodeposition (ED) time (tED) and ED current (IED) were varied to control the film thickness and morphology. Furthermore, the crystallization of the thin films was controlled by annealing them at 250°C, 500°C, and 700°C. The results showed that the thickness of the WO3thin films increased withtEDandIED. The as-deposited thin films and those annealed at 250°C were amorphous, whereas the WO3thin films annealed at 500 and 700°C were in the anorthic phase. Moreover, the amorphous WO3-coated glass exhibited high transmittance in visible light and low transmittance in near-infrared light, whereas the anorthic WO3-coated glass had high transmittance in near-infrared light. An empirical formula for determining the thickness of WO3thin films was derived through multiple regressions of the ED process parameters.


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