Influence of Airfoil Shape and Incidence Angle on High-Frequency Gust Interaction Noise

1993 ◽  
pp. 765-782
Author(s):  
E. J. Kerschen ◽  
C. T. Tsai ◽  
M. R. Myers
Keyword(s):  
High Frequency ◽  
Incidence Angle

Influence of camber on sound generation by airfoils interacting with high-frequency gusts

1997 ◽  
Vol 353 ◽  
pp. 221-259 ◽  
Author(s):  
MATTHEW R. MYERS ◽  
E. J. KERSCHEN
Keyword(s):  
Flat Plate ◽  
High Frequency ◽  
Incidence Angle ◽  
Outer Region ◽  
Asymptotic Region ◽  
Mean Flow ◽  
Previous Theory ◽  
Airfoil Surface ◽  
Curvature Effects ◽  
Flow Past

A theoretical model is developed for the sound generated when a convected disturbance encounters a cambered airfoil at non-zero angle of attack. The model is a generalization of a previous theory for a flat-plate airfoil, and is based on a linearization of the Euler equations about the steady, subsonic flow past the airfoil. High-frequency gusts, whose wavelengths are short compared to the airfoil chord, are considered. The airfoil camber and incidence angle are restricted so that the mean flow past the airfoil is a small perturbation to a uniform flow. The singular perturbation analysis retains the asymptotic regions present in the case of a flat-plate airfoil: local regions, which scale on the gust wavelength, at the airfoil leading and trailing edges; a ‘transition’ region behind the airfoil which is similar to the transition zone between illuminated and shadow regions in optical problems; and an outer region, far away from the airfoil edges and wake, in which the solution has a geometric-acoustics form. For the cambered airfoil, an additional asymptotic region in the form of an acoustic boundary layer adjacent to the airfoil surface is required in order to account for surface curvature effects. Parametric calculations are presented which illustrate that, like incidence angle, moderate amounts of airfoil camber can significantly affect the sound field produced by airfoil–gust interactions. Most importantly, the amount of radiated sound power is found to correlate very well with a single aerodynamic loading parameter, αeff, which is an effective mean-flow incidence angle for the airfoil leading edge.

s- and p-Polarized Infrared Specular Reflectance of Vitreous Silica at Oblique Incidences: Detection of LO Modes

2000 ◽  
Vol 54 (4) ◽  
pp. 502-507 ◽  
Author(s):  
B. C. Trasferetti ◽  
C. U. Davanzo
Keyword(s):  
High Frequency ◽  
Incidence Angle ◽  
Polarized Light ◽  
Blue Shift ◽  
Refraction Index ◽  
Vitreous Silica ◽  
Reflectance Spectra ◽  
Specular Reflectance ◽  
Longitudinal Optic ◽  
Asymmetrical Mode

Infrared (IR) specular reflectance spectra of a semi-infinite sample of vitreous silica (v-SiO2) were obtained with the use of both s- and p-polarized light and oblique incidence angles. The optical constants of the material and hence its longitudinal optic/transverse optic (LO-TO) functions were determined through the Kramers–Krönig analysis (KKA) of its s-polarized 20° off-normal reflectance spectrum. p-Polarized spectra had their reflection maxima blue-shifting as the incidence angle increased, while they remained unchanged for the s-polarized spectra. Since an LO mode generally lies at wavenumbers higher than its respective TO mode, such a blue shift may be due to the detection of the LO mode in addition to the TO mode as incidence angle increased. The only exception to this observation was the high-frequency shoulder, which underwent a sharp intensification as the incidence increased. The present work shows that it is indeed brought about by the weakly IR active asymmetrical mode (AS2) but only because it takes place immediately after the intense AS1 mode, which causes the refraction index spectrum to have a broad dip below unity. Such a dip is proven to be responsible for the sharp increase in the high-frequency shoulder of the reflectance spectra.

scholarly journals Kathmandu Basin as a local modulator of seismic waves: 2D modelling of nonlinear site response under obliquely incident waves

2021 ◽  
Author(s):  
Elif Oral ◽  
Peyman Ayoubi ◽  
Jean-Paul Ampuero ◽  
Domniki Asimaki ◽  
Luis Bonilla
Keyword(s):  
Wave Propagation ◽  
Ground Motion ◽  
High Frequency ◽  
Site Response ◽  
Incidence Angle ◽  
Capital City ◽  
Seismic Behaviour ◽  
Soil Nonlinearity ◽  
Nonlinear Site Response ◽  
Basin Geometry

The 2015 Mw 7.8 Gorkha, Nepal earthquake is the largest event to have struck the capital city of Kathmandu in recent times. One of its surprising features was the frequency content of the recorded ground motion, exhibiting a notable amplification at low frequencies (< 2 Hz) and a contrasting depletion at higher frequencies. The latter has been partially attributed to the damper behaviour of the Kathmandu basin. While such weak high-frequency ground motion helped avoiding severe damage in the city, the catastrophic outcomes of earlier earthquakes in the region attest to a contrasting role of the Kathmandu basin as a broadband amplifier, in addition to possible source effects. Given the possibility of future strong events in the region, our main objective is to elucidate the seismic behaviour of the Kathmandu basin by focusing on site effects. We numerically model 2D P-SV wave propagation in a broad frequency band (up to 10 Hz), incorporating the most recent data for the Kathmandu basin geometry, soil stratigraphy and geotechnical soil properties, and accounting for the non-linear effect of multi-dimensional soil plasticity on wave propagation. We find that: 1) the Kathmandu basin generally amplifies low frequency ground motion (< 2 Hz); 2) waves with large incidence angles relative to vertical can dramatically amplify the high frequency ground motion with respect to bedrock despite the damping effect of soil nonlinearity; 3) the spatial distribution of peak ground motion amplitudes along the basin is highly sensitive to soil nonlinearity and wave incidence (angle and direction), favoring larger values near the basin edges located closer to the source, as observed during the 2015 event. Our modelling approach and findings can support the ongoing resilience practices in Nepal and can guide future seismic hazard assessment studies for other sites that feature similar complexities in basin geometry, soil stratigraphy and dynamic soil behaviour.

Influence of incidence angle on sound generation by airfoils interacting with high-frequency gusts

1995 ◽  
Vol 292 ◽  
pp. 271-304 ◽  
Author(s):  
Matthew R. Myers ◽  
E. J. Kerschen
Keyword(s):  
High Frequency ◽  
Incidence Angle ◽  
Outer Region ◽  
Sound Field ◽  
Leading Edge ◽  
Edge Region ◽  
Sound Generation ◽  
Mean Flow ◽  
Flow Stagnation ◽  
Trailing Edges

A theoretical model is developed for the sound generated when a convected vortical or entropic gust encounters an airfoil at non-zero angle of attack. The theory is based on a linearization of the Euler equations about the steady subsonic flow past the airfoil. High-frequency gusts, whose wavelengths are short compared to the airfoil chord, but long compared to the displacement of the mean-flow stagnation point from the leading edge, are considered. The analysis utilizes singular-perturbation techniques and involves four asymptotic regions. Local regions, which scale on the gust wavelength, are present at the airfoil leading and trailing edges. Behind the airfoil a ‘transition’ region, which is similar to the transition zone between illuminated and shadow zones in optical problems, is present. In the outer region, far away from the airfoil edges and wake, the solution has a geometric-acoustics form. The primary sound generation is found to be concentrated in the local leading-edge region. The trailing edge plays a secondary role as a scatterer of the sound generated in the leading-edge region. Parametric calculations are presented which illustrate that moderate levels of airfoil steady loading can significantly affect the sound field produced by airfoil–gust interactions.

Dynamic Stress Concentration Around Shallow-Buried Circle Cavity Under Transient P Wave Loads in Different Conditions

2020 ◽  
Author(s):  
Ming Tao ◽  
Linqi Huang ◽  
Xibing Li ◽  
Shaofeng Wang
Keyword(s):  
Stress Concentration ◽  
Tensile Stress ◽  
Compressive Stress ◽  
High Frequency ◽  
Dynamic Stress ◽  
Incidence Angle ◽  
Low Frequency ◽  
Dynamic Stress Concentration ◽  
Burial Depth ◽  
Addition Formula

&lt;p&gt;Based on the large-arc assumption, an analytical model is established and solved by using the complex variable function method to illustrate the dynamic stress concentration around a shallow-buried cavity under transient loads. The jump points in the dynamic stress concentration factor (DSCF) curve that do not in line with the overall trend is filtered out to obtain more reasonable results. The convergence speed of the Graf addition formula is examined, as well as the effects of the incidence angle, frequency, and burial depth on the DSCF around the cavity. Examples show that a larger arc radius and a higher incident frequency correspond to slower convergence of the Graf addition formula. There are differences between the DSCF distributions of high-frequency incidents (such as blasting waves) and low-frequency incidents (such as seismic waves). There are three tensile-stress zones and three compressive-stress zones approximately equally spaced around the cavity in the low-frequency case, and there are two tensile-stress zones and two compressive-stress zones in the high-frequency case. Regarding the variation of the DSCFs with respect to the cavity depth, incidence angle and position of wave peak there are significant differences between the high- and low-frequency cases.&lt;/p&gt;

Electron Channeling Patterns

1977 ◽  
Vol 35 ◽  
pp. 12-13
Author(s):  
David C. Joy
Keyword(s):  
Electron Diffraction ◽  
Incidence Angle ◽  
Photographic Plate ◽  
Diffraction Effect ◽  
Angle Of Incidence ◽  
Bulk Single Crystal ◽  
Time Resolved ◽  
Electron Channeling ◽  
Spatially Resolved ◽  
Large Bulk

Electron channeling patterns (ECP) were first found by Coates (1967) while observing a large bulk, single crystal of silicon in a scanning electron microscope. The geometric pattern visible was shown to be produced as a result of the changes in the angle of incidence, between the beam and the specimen surface normal, which occur when the sample is examined at low magnification (Booker, Shaw, Whelan and Hirsch 1967).A conventional electron diffraction pattern consists of an angularly resolved intensity distribution in space which may be directly viewed on a fluorescent screen or recorded on a photographic plate. An ECP, on the other hand, is produced as the result of changes in the signal collected by a suitable electron detector as the incidence angle is varied. If an integrating detector is used, or if the beam traverses the surface at a fixed angle, then no channeling contrast will be observed. The ECP is thus a time resolved electron diffraction effect. It can therefore be related to spatially resolved diffraction phenomena by an application of the concepts of reciprocity (Cowley 1969).

Atomic force microscopy (AFM) of the topography of silicon surfaces exposed to ion beams

1992 ◽  
Vol 50 (2) ◽  
pp. 1132-1133
Author(s):  
Mark Denker ◽  
Jennifer Wall ◽  
Mark Ray ◽  
Richard Linton
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Incidence Angle ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beams ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Trace Impurities ◽  
Energy Dose

Reactive ion beams such as O2+ and Cs+ are used in Secondary Ion Mass Spectrometry (SIMS) to analyze solids for trace impurities. Primary beam properties such as energy, dose, and incidence angle can be systematically varied to optimize depth resolution versus sensitivity tradeoffs for a given SIMS depth profiling application. However, it is generally observed that the sputtering process causes surface roughening, typically represented by nanometer-sized features such as cones, pits, pyramids, and ripples. A roughened surface will degrade the depth resolution of the SIMS data. The purpose of this study is to examine the relationship of the roughness of the surface to the primary ion beam energy, dose, and incidence angle. AFM offers the ability to quantitatively probe this surface roughness. For the initial investigations, the sample chosen was <100> silicon, and the ion beam was O2+.Work to date by other researchers typically employed Scanning Tunneling Microscopy (STM) to probe the surface topography.

The Microstructure of Steatite (Protoenstatite)

1985 ◽  
Vol 43 ◽  
pp. 236-237
Author(s):  
W. E. Lee ◽  
A. H. Heuer
Keyword(s):  
High Frequency ◽  
Glass Ceramics ◽  
Magnesium Silicate ◽  
Beam Current ◽  
Glassy Matrix ◽  
Angle Of Incidence ◽  
X Ray ◽  
Mechanical And Electrical Properties ◽  
Argon Ions ◽  
High Temperature Polymorph

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.

Principle and practice of high-resolution imaging with a field-emission TEM

1992 ◽  
Vol 50 (1) ◽  
pp. 138-139
Author(s):  
Max T. Otten ◽  
Wim M.J. Coene
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Incidence Angle ◽  
Temporal Coherence ◽  
Energy Spread ◽  
High Resolution Imaging ◽  
Major Improvement ◽  
High Resolution Images ◽  
Resolution Imaging

High-resolution imaging with a LaB6 instrument is limited by the spatial and temporal coherence, with little contrast remaining beyond the point resolution. A Field Emission Gun (FEG) reduces the incidence angle by a factor 5 to 10 and the energy spread by 2 to 3. Since the incidence angle is the dominant limitation for LaB6 the FEG provides a major improvement in contrast transfer, reducing the information limit to roughly one half of the point resolution. The strong improvement, predicted from high-resolution theory, can be seen readily in diffractograms (Fig. 1) and high-resolution images (Fig. 2). Even if the information in the image is limited deliberately to the point resolution by using an objective aperture, the improved contrast transfer close to the point resolution (Fig. 1) is already worthwhile.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

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