Electron Channeling Patterns

1977 ◽  
Vol 35 ◽  
pp. 12-13
Author(s):  
David C. Joy
Keyword(s):  
Electron Diffraction ◽  
Incidence Angle ◽  
Photographic Plate ◽  
Diffraction Effect ◽  
Angle Of Incidence ◽  
Bulk Single Crystal ◽  
Time Resolved ◽  
Electron Channeling ◽  
Spatially Resolved ◽  
Large Bulk

Electron channeling patterns (ECP) were first found by Coates (1967) while observing a large bulk, single crystal of silicon in a scanning electron microscope. The geometric pattern visible was shown to be produced as a result of the changes in the angle of incidence, between the beam and the specimen surface normal, which occur when the sample is examined at low magnification (Booker, Shaw, Whelan and Hirsch 1967).A conventional electron diffraction pattern consists of an angularly resolved intensity distribution in space which may be directly viewed on a fluorescent screen or recorded on a photographic plate. An ECP, on the other hand, is produced as the result of changes in the signal collected by a suitable electron detector as the incidence angle is varied. If an integrating detector is used, or if the beam traverses the surface at a fixed angle, then no channeling contrast will be observed. The ECP is thus a time resolved electron diffraction effect. It can therefore be related to spatially resolved diffraction phenomena by an application of the concepts of reciprocity (Cowley 1969).

ZnCdO/ZnMgO and ZnO/AlGaN Heterostructures for UV and Visible Light Emitters

2005 ◽  
Vol 892 ◽  
Author(s):  
Andrei Osinsky ◽  
Jianwei Dong ◽  
J. Q. Xie ◽  
B. Hertog ◽  
A. M. Dabiran ◽  
...  
Keyword(s):  
Molecular Beam ◽  
Compositional Analysis ◽  
Optical Emission ◽  
Rf Plasma ◽  
Light Emitters ◽  
Time Resolved ◽  
Light Emitting ◽  
Spatially Resolved ◽  
Time Resolved Photoluminescence ◽  
Made In

AbstractThis paper reviews of some of the progress made in the development of ZnO-based light emitting diodes (LEDs). n-ZnO/p-AlGaN-based heterostructures have been successfully for the fabrication of UV emitting LEDs that have operated at temperatures up to 650K, suggesting an excitonic origin for the optical transitions. RF-plasma-assisted molecular beam epitaxy has been used to grow epitaxial CdxZn1-xO films on GaN/sapphire structure. These films have a single-crystal wurtzite structure as demonstrated by structural and compositional analysis. High quality CdxZn1-xO films were grown with up to x=0.78 mole fraction as determined by RBS and SIMS techniques. Optical emission ranging from purple (Cd0.05Zn0.95O) to yellow (Cd0.29Zn0.71O) was observed. Compositional fluctuations in a Cd0.16Zn0.84O films were not detected by spatially resolved CL measurements, although intensity fluctuation with features of ∼0.5 μm diameter were seen on the intensity maps. Time resolved photoluminescence shows multi-exponential decay with 21 psec. and 49±3 psec. lifetimes, suggesting that composition micro-fluctuations may be present in Cd0.16Zn0.84O film.

scholarly journals Femtosecond time-resolved MeV electron diffraction

2015 ◽  
Vol 17 (6) ◽  
pp. 063004 ◽  
Author(s):  
Pengfei Zhu ◽  
Y Zhu ◽  
Y Hidaka ◽  
L Wu ◽  
J Cao ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Time Resolved

Low-Energy Ion Scattering Measurements from an Al-Pd-Mn Quasicrystal

2000 ◽  
Vol 643 ◽  
Author(s):  
R. Bastasz ◽  
C. J. Jenks ◽  
T. A. Lograsso ◽  
A. R. Ross ◽  
P. A. Thiel ◽  
...  
Keyword(s):  
Signal Intensity ◽  
Surface Composition ◽  
Incidence Angle ◽  
Local Environment ◽  
Forward Direction ◽  
Low Energy ◽  
Angle Of Incidence ◽  
Fold Axis ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

AbstractEnergy-angle distributions of low-energy inert-gas ions scattered from surfaces provide information about surface composition and structure. We have measured energy spectra of He+ scattered from an Al71Pd20Mn9 quasicrystal, which was oriented perpendicular to the 5-fold axis, along various azimuthal directions. Strong scattering signals are seen from Al and Pd, but only a weak Mn signal is observed. From measurements made of He+ at an oblique angle of incidence scattered in the forward direction, we observe a 72° periodicity in the azimuthal dependence of the scattering signal intensity from Al surface atoms. The effect arises from shadowing effects involving neighboring surface atoms and provides direct evidence that Al surface atoms exist in a local environment with 5-fold symmetry. In addition, measuring the variation of the signal intensity with incidence angle provides information about neighboring atom distances, which compare favorably with a model of the quasicrystal surface derived from the bulk structure.

scholarly journals Method for fast determination of the angle of ionizing radiation incidence from data measured by a Timepix3 detector

2021 ◽  
Vol 10 (1) ◽  
pp. 63-70
Author(s):  
Felix Lehner ◽  
Jürgen Roth ◽  
Oliver Hupe ◽  
Marc Kassubeck ◽  
Benedikt Bergmann ◽  
...  
Keyword(s):  
Ionizing Radiation ◽  
Incidence Angle ◽  
Computation Time ◽  
Incident Radiation ◽  
Angle Of Incidence ◽  
Time Behavior ◽  
Calculation Algorithm ◽  
3D Geometry ◽  
Photon Event ◽  
Radiation Incidence

Abstract. This paper presents a method of how to determine spatial angles of ionizing radiation incidence quickly, using a Timepix3 detector. This work focuses on the dosimetric applications where detectors and measured quantities show significant angle dependencies. A determined angle of incidence can be used to correct for the angle dependence of a planar Timepix3 detector. Up until now, only passive dosemeters have been able to provide a correct dose and preserve the corresponding incidence angle of the radiation. Unfortunately, passive dosemeters cannot provide this information in “real” time. In our special setup we were able to retrieve the spatial angles with a runtime of less than 600 ms. Employing the new Timepix3 detector enables the use of effective data analysis where the direction of incident radiation is computed from a simple photon event map. In order to obtain this angle, we combine the information extracted from the map with known 3D geometry surrounding the detector. Moreover, we analyze the computation time behavior, conditions and optimizations of the developed spatial angle calculation algorithm.

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