Nondestructive Characterization of Cryogenic Materials for Quality and Process Control

1986 ◽  
pp. 479-488
Author(s):  
Jean F. Bussière
Keyword(s):  
Process Control ◽  
Nondestructive Characterization

Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics

2010 ◽  
Author(s):  
Martin Kittler ◽  
Tzanimir Arguirov ◽  
Reiner Schmid ◽  
Winfried Seifert ◽  
Teimuraz Mchedlidze
Keyword(s):  
Solar Cells ◽  
Process Control ◽  
Crystalline Silicon ◽  
Crystal Defects ◽  
Induced Current ◽  
Line Defect ◽  
Electron Beam Induced Current ◽  
Solar Si ◽  
Nondestructive Characterization

Abstract Crystalline silicon used for fabrication of solar cells, such as multicrystalline silicon (mc-Si), contains a high density of extended crystal defects. Since mc-Si wafers exhibit an inhomogeneous defect distribution, there is a need to combine the spectral capabilities with the ability of spatially resolving the defect areas. This paper reports application of luminescence and electron-beam-induced current (EBIC) techniques for characterization of defects in solar Si. The first part introduces luminescence features of defective Si and discusses application examples. The second part starts with explanation of the EBIC technique, including details about the temperature dependence of the EBIC defect contrast c(T). Then, application examples of the c(T) behavior and the analysis of the "interaction" of grain boundaries with p-n junctions are discussed. The paper demonstrates the potential of luminescence for nondestructive characterization of Si wafers and solar cells in terms of in-line defect detection and process control.

A Possible Basis for Nondestructive Characterization of Ropes of Nylon 6

1997 ◽  
Vol 503 ◽  
Author(s):  
H. Jiang ◽  
M. K. Davis ◽  
R. K. Eby ◽  
P. Arsenovic
Keyword(s):  
Tensile Strength ◽  
Service Life ◽  
Fiber Diameter ◽  
Structural Parameters ◽  
Crystal Form ◽  
Nylon 6 ◽  
Remaining Service Life ◽  
Nondestructive Characterization ◽  
Fractional Content

ABSTRACTPhysical properties and structural parameters have been measured for ropes of nylon 6 as a function of the number of use operations. The fractional content of the α crystal form, sound velocity, birefringence, tensile strength and length all increase systematically and significantly with increasing the number of use operations. The fractional content of the γ crystal form and fiber diameter decrease with use. These trends indicate that the measurement of such properties and structural parameters, especially the length, provide a possible basis for establishing a reliable, rapid, and convenient nondestructive characterization method to predict the remaining service life of nylon 6 ropes.

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering
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