A Simple, Fast Technique for the Sample Preparation of Composite Metal Powders for Analysis by X-ray Fluorescence

The quality and reliability of cohesive soil laboratory test data can be significantlyaffected by sample disturbance during sampling or sample preparation. Sample disturbance may affect key design and modelling parameters such as stiffness, preconsolidation stress, compressibility and undrained shear strength, and ultimately determine particle mobilization and shear plane development. The use of X-ray computed tomography (X-CT) in the study of soil is restricted by the inverse relationship of specimen size and obtainable image resolution. This has led to the testing of miniature specimen sizes which are far less than conventional laboratory sample size in a bid to obtain high resolution images and detailed particle-scale soil properties; however, these miniature soil specimens are more prone to sample disturbance. In this work 2% muscovite was mixed with speswhite kaolin clay as a strain marker for use in X-CT. The clay soil sample was prepared from slurry and either consolidated using an oedometer or a gypsum mould. Specimens obtained from a 7 mm tube sampler were compared to lathe trimmed specimens with a diameter (Ø) of 7 mm. Results from X-CT imaging were used to study the influence of sampler type on specimen disturbance, by analysing the muscovite particle orientation of the obtained 3D images. The results show that; for samples subjected to large consolidation stress (>200kpa) lathe trimmed specimens may be subject to lesser disturbance compared to tube sampled specimens.

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Influence of the sample preparation method of the ultra-small-angle x-ray scattering of lightly sulfonated polystyrenes

Macromolecules ◽

10.1021/ma00067a055 ◽

1993 ◽

Vol 26 (15) ◽

pp. 4064-4066 ◽

Cited By ~ 12

Author(s):

B. P. Grady ◽

H. Matsuoka ◽

Y. Nakatani ◽

S. L. Cooper ◽

N. Ise

Keyword(s):

Sample Preparation ◽

Small Angle ◽

Preparation Method ◽

Sample Preparation Method ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Influence of X-Ray Diffraction Sample Preparation on Quantitative Mineralogy

Journal of Environmental Quality ◽

10.2134/jeq2006.0215 ◽

2007 ◽

Vol 36 (2) ◽

pp. 487-497 ◽

Cited By ~ 15

Author(s):

Dimitris Dermatas ◽

Maria Chrysochoou ◽

Sarra Pardali ◽

Dennis G. Grubb

Keyword(s):

Sample Preparation ◽

X Ray Diffraction ◽

X Ray ◽

Quantitative Mineralogy

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A prototype handheld X-ray diffraction instrument

Journal of Applied Crystallography ◽

10.1107/s1600576718012943 ◽

2018 ◽

Vol 51 (6) ◽

pp. 1571-1585 ◽

Cited By ~ 1

Author(s):

Graeme Hansford

Keyword(s):

Sample Preparation ◽

Mineralogical Composition ◽

General Purpose ◽

Performance Criteria ◽

X Ray Diffraction ◽

X Ray ◽

Fine Grained ◽

Back Reflection ◽

Promising Area ◽

Sample Position

A conceptual design for a handheld X-ray diffraction (HHXRD) instrument is proposed. Central to the design is the application of energy-dispersive XRD (EDXRD) in a back-reflection geometry. This technique brings unique advantages which enable a handheld instrument format, most notably, insensitivity to sample morphology and to the precise sample position relative to the instrument. For fine-grained samples, including many geological specimens and the majority of common alloys, these characteristics negate sample preparation requirements. A prototype HHXRD device has been developed by minor modification of a handheld X-ray fluorescence instrument, and the performance of the prototype has been tested with samples relevant to mining/quarrying and with an extensive range of metal samples. It is shown, for example, that the mineralogical composition of iron-ore samples can be approximately quantified. In metals analysis, identification and quantification of the major phases have been demonstrated, along with extraction of lattice parameters. Texture analysis is also possible and a simple example for a phosphor bronze sample is presented. Instrument formats other than handheld are possible and online process control in metals production is a promising area. The prototype instrument requires extended measurement times but it is argued that a purpose-designed instrument can achieve data-acquisition times below one minute. HHXRD based on back-reflection EDXRD is limited by the low resolution of diffraction peaks and interference by overlapping fluorescence peaks and, for these reasons, cannot serve as a general-purpose XRD tool. However, the advantages ofin situ, nondestructive and rapid measurement, tolerance of irregular surfaces, and no sample preparation requirement in many cases are potentially transformative. For targeted applications in which the analysis meets commercially relevant performance criteria, HHXRD could become the method of choice through sheer speed and convenience.

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Sample Preparation and Methodology for X-Ray Quantitative Analysis of Thin Aerosol Layers Deposited on Glass Fiber and Membrane Filters

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_44 ◽

1982 ◽

pp. 295-300 ◽

Cited By ~ 4

Author(s):

Briant L. Davis ◽

L. Ronald Johnson

Keyword(s):

Quantitative Analysis ◽

Sample Preparation ◽

Glass Fiber ◽

X Ray ◽

Membrane Filters

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GOLD PROVENANCE AND CHARACTERIZATION USING MICRO X-RAY FLUORESCENCE (µXRF): PRELIMINARY RESULTS/ PROVENIÊNCIA E CARACTERIZAÇÃO DE OURO COM MICRO FLUORESCÊNCIA DE RAIOS X (μXRF): RESULTADOS PRELIMINARES

Journal of Sedimentary Environments ◽

10.12957/jse.2018.37905 ◽

2018 ◽

Vol 3 (3) ◽

pp. 155-165

Author(s):

William Murussi Canto ◽

Hamilton Santos Gama Filho ◽

Marcelino José dos Anjos ◽

Armando Dias Tavares Jr. ◽

Mauro César Geraldes

Keyword(s):

Sample Preparation ◽

Pure Gold ◽

Noninvasive Technique ◽

X Ray ◽

Preliminary Results ◽

Icp Ms ◽

Para Determinar ◽

Made In ◽

Gold Digging

This work presents some preliminary results that allows to characterize gold samples using Micro X-Ray Fluorescence/µXRF. The first aim of this work is to apply a noninvasive technique, preserving the sample integrity, in order to identify the composition of gold samples and to recognize their possible geographical provenance. Samples have been obtained in geographically distinct gold-digging sites, in three Brazilian and one Colombian areas. These samples were processed only by fusion into a furnace at 1,200 ºC. The proportion of Au, Ag and Cu were measured in gold samples. The results of this work, allowed to characterize and to identify quite well the pure gold provenance, using µXRF instrumentation and related techniques. Further work is in progress to determine the behavior of mixed gold samples from different provenances. Besides that, measurements with different sample preparation will be made, in order to compare the results obtained in this work with those obtained by LA-ICP-MS techniques. ResumoEste trabalho apresenta resultados preliminares que permitem caracterizar amostras de ouro utilizando a Micro Fluorescência de Raios-X/ µXRF. O primeiro objetivo deste trabalho é aplicar uma técnica não invasiva, preservando a integridade da amostra, para identificar a composição de amostras de ouro e reconhecer a sua possível proveniência geográfica. As amostras foram obtidas em locais de exploração de ouro geograficamente distintos, em três áreas brasileiras e uma colombiana. Estas amostras foram sugeitas a fusão a 1.200 ºC, num forno. A proporção de Au, Ag e Cu foi medida em amostras de ouro. Os resultados deste trabalho permitiram caracterizar e claramente identificar a proveniência de ouro puro, utilizando resultados de µXRF. Estão em andamento outros trabalhos para determinar o comportamento da mistura de amostras de ouro de diferentes procedências. Além disso, serão efetuadas medições com diferentes preparações de amostras, a fim de comparar os resultados obtidos neste trabalho com os que estão sendo aquiridos com técnicas de LA-ICP-MS.

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Three Dimensional X-Ray Computed Tomography in Materials Science

MRS Bulletin ◽

10.1557/s0883769400066525 ◽

1988 ◽

Vol 13 (1) ◽

pp. 13-18 ◽

Cited By ~ 27

Author(s):

J.H. Kinney ◽

Q.C. Johnson ◽

U. Bonse ◽

M.C. Nichols ◽

R.A. Saroyan ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Sample Preparation ◽

Visible Light ◽

Three Dimensional ◽

Materials Characterization ◽

Imaging Technology ◽

X Ray ◽

X Ray Imaging ◽

Visible Light Imaging

Imaging is the cornerstone of materials characterization. Until the middle of the present century, visible light imaging provided much of the information about materials. Though visible light imaging still plays an extremely important role in characterization, relatively low spatial resolution and lack of chemical sensitivity and specificity limit its usefulness.The discovery of x-rays and electrons led to a major advance in imaging technology. X-ray diffraction and electron microscopy allowed us to characterize the atomic structure of materials. Many materials vital to our high technology economy and defense owe their existence to the understanding of materials structure brought about with these high-resolution methods.Electron microscopy is an essential tool for materials characterization. Unfortunately, electron imaging is always destructive due to the sample preparation that must be done prior to imaging. Furthermore, electron microscopy only provides information about the surface of a sample. Three dimensional information, of great interest in characterizing many new materials, can be obtained only by time consuming sectioning of an object.The development of intense synchrotron light sources in addition to the improvements in solid state imaging technology is revolutionizing materials characterization. High resolution x-ray imaging is a potentially valuable tool for materials characterization. The large depth of x-ray penetration, as well as the sensitivity of absorption crosssections to atomic chemistry, allows x-ray imaging to characterize the chemistry of internal structures in macroscopic objects with little sample preparation. X-ray imaging complements other imaging modalities, such as electron microscopy, in that it can be performed nondestructively on metals and insulators alike.

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