Quantitative Analysis of Reflection Spectra: Evaluation of Simulated Reflection Spectra

Author(s):  
J. Hoffmann ◽  
D. W. Lübbers
1974 ◽  
Vol 28 (3) ◽  
pp. 247-255 ◽  
Author(s):  
D. M. Sanders ◽  
W. B. Person ◽  
L. L. Hench

It is predicted theoretically and justified experimentally that infrared reflectances are proportional to the concentrations of the vibrational species causing them. In the binary Li2O-, Na2O-, and K2O-SiO2 glasses used in this study, the reflection peaks have been assigned to vibrations of single silicon-oxygen tetrahedra in different symmetry environments caused by the presence of alkali ions. Care has been taken here in recording the spectra of high alkali glasses to prevent chemical reactions with water vapor in the atmosphere. The influence of phase separation on reflection spectra is also discussed.


1993 ◽  
Vol 140 (5) ◽  
pp. 1425-1429 ◽  
Author(s):  
James E. Franke ◽  
Lizhong Zhang ◽  
Thomas M. Niemczyk ◽  
David M. Haaland ◽  
Jack H. Linn

Author(s):  
J.P. Fallon ◽  
P.J. Gregory ◽  
C.J. Taylor

Quantitative image analysis systems have been used for several years in research and quality control applications in various fields including metallurgy and medicine. The technique has been applied as an extension of subjective microscopy to problems requiring quantitative results and which are amenable to automatic methods of interpretation.Feature extraction. In the most general sense, a feature can be defined as a portion of the image which differs in some consistent way from the background. A feature may be characterized by the density difference between itself and the background, by an edge gradient, or by the spatial frequency content (texture) within its boundaries. The task of feature extraction includes recognition of features and encoding of the associated information for quantitative analysis.Quantitative Analysis. Quantitative analysis is the determination of one or more physical measurements of each feature. These measurements may be straightforward ones such as area, length, or perimeter, or more complex stereological measurements such as convex perimeter or Feret's diameter.


Author(s):  
V. V. Damiano ◽  
R. P. Daniele ◽  
H. T. Tucker ◽  
J. H. Dauber

An important example of intracellular particles is encountered in silicosis where alveolar macrophages ingest inspired silica particles. The quantitation of the silica uptake by these cells may be a potentially useful method for monitoring silica exposure. Accurate quantitative analysis of ingested silica by phagocytic cells is difficult because the particles are frequently small, irregularly shaped and cannot be visualized within the cells. Semiquantitative methods which make use of particles of known size, shape and composition as calibration standards may be the most direct and simplest approach to undertake. The present paper describes an empirical method in which glass microspheres were used as a model to show how the ratio of the silicon Kα peak X-ray intensity from the microspheres to that of a bulk sample of the same composition correlated to the mass of the microsphere contained within the cell. Irregular shaped silica particles were also analyzed and a calibration curve was generated from these data.


Author(s):  
H.J. Dudek

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S


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