Quantification of Silica Uptake by Alveolar Macrophages - An Emperical Scanning Electron Microprobe Method

1982 ◽  
Vol 40 ◽  
pp. 332-333
Author(s):  
V. V. Damiano ◽  
R. P. Daniele ◽  
H. T. Tucker ◽  
J. H. Dauber
Keyword(s):  
Quantitative Analysis ◽  
Alveolar Macrophages ◽  
Bulk Sample ◽  
Silica Particles ◽  
Empirical Method ◽  
Phagocytic Cells ◽  
Calibration Standards ◽  
X Ray ◽  
Accurate Quantitative Analysis ◽  
Scanning Electron

An important example of intracellular particles is encountered in silicosis where alveolar macrophages ingest inspired silica particles. The quantitation of the silica uptake by these cells may be a potentially useful method for monitoring silica exposure. Accurate quantitative analysis of ingested silica by phagocytic cells is difficult because the particles are frequently small, irregularly shaped and cannot be visualized within the cells. Semiquantitative methods which make use of particles of known size, shape and composition as calibration standards may be the most direct and simplest approach to undertake. The present paper describes an empirical method in which glass microspheres were used as a model to show how the ratio of the silicon Kα peak X-ray intensity from the microspheres to that of a bulk sample of the same composition correlated to the mass of the microsphere contained within the cell. Irregular shaped silica particles were also analyzed and a calibration curve was generated from these data.

scholarly journals Integrated Electron and X-Ray Induced Microbeam XRF in the SEM

2004 ◽  
Vol 12 (4) ◽  
pp. 20-23 ◽  
Author(s):  
Brian J. Cross ◽  
Kenny C. Witherspoon
Keyword(s):  
Trace Elements ◽  
Electron Microscope ◽  
Quantitative Analysis ◽  
Compositional Analysis ◽  
X Rays ◽  
Complementary Information ◽  
Secondary Electrons ◽  
X Ray ◽  
Accurate Quantitative Analysis ◽  
Scanning Electron

Energy-Dispersive X-Ray Spectroscopy (ED-XRS or EDS) is a powerful and easy-to-use technique for the elemental analysis of a wide variety of materials. Most commonly, this technique is called X-Ray Fluorescence (XRF), which classically uses x-ray photon sources to excite the sample. A Scanning Electron Microscope (SEM), of course, uses electrons as the excitation source for microbeam x-ray spectroscopy together with sample imaging using characteristic x-rays and/or secondary electrons. These two XRS techniques are used independently, although often the same sample is analysed by both, to provide complementary information.The advantages of both techniques have been reviewed several times [e.g. 1,2], SEM-EDS being more suited to imaging and microbeam quantitative compositional analysis and maps, and XRF more suited to accurate quantitative analysis, especially for trace elements, while analyzing a much larger area.

Quantitative Analysis Of X-Ray Images From Geological Materials

1990 ◽  
Vol 48 (2) ◽  
pp. 244-245
Author(s):  
J. M. Paque ◽  
R. Browning ◽  
P. L. King ◽  
P. Pianetta
Keyword(s):  
Quantitative Analysis ◽  
Bulk Composition ◽  
Principal Component ◽  
Analytical Description ◽  
Bulk Sample ◽  
Geological Samples ◽  
X Ray ◽  
Software And Hardware ◽  
And Storage ◽  
Insight Into

Geological samples typically contain many minerals (phases) with multiple element compositions. A complete analytical description should give the number of phases present, the volume occupied by each phase in the bulk sample, the average and range of composition of each phase, and the bulk composition of the sample. A practical approach to providing such a complete description is from quantitative analysis of multi-elemental x-ray images.With the advances in recent years in the speed and storage capabilities of laboratory computers, large quantities of data can be efficiently manipulated. Commercial software and hardware presently available allow simultaneous collection of multiple x-ray images from a sample (up to 16 for the Kevex Delta system). Thus, high resolution x-ray images of the majority of the detectable elements in a sample can be collected. The use of statistical techniques, including principal component analysis (PCA), can provide insight into mineral phase composition and the distribution of minerals within a sample.

scholarly journals Effect of Surfactant Addition on Bi2Te3 Nanostructures Synthesized by Hydrothermal Method

2017 ◽  
Vol 62 (2) ◽  
pp. 1005-1010 ◽  
Author(s):  
Peyala Dharmaiah ◽  
C.H. Lee ◽  
B. Madavali ◽  
Soon-Jik Hong
Keyword(s):  
Electron Microscopy ◽  
Hydrothermal Method ◽  
Figure Of Merit ◽  
Bulk Sample ◽  
The Other ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coarse Grains ◽  
Scanning Electron ◽  
Nanostructured Sample

AbstractIn the present work, we have prepared Bi2Te3nanostructures with different morphologies such as nano-spherical, nanoplates and nanoflakes obtained using various surfactant additions (EG, PVP, and EDTA) by a hydrothermal method. The shape of the nanoparticles can be controlled by addition of surfactants. The samples were characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM). It is found that the minority BiOCl phase disappears after maintained pH at 10 with EG as surfactant. SEM bulk microstructure reveals that the sample consists of fine and coarse grains. Temperature dependence of thermoelectric properties of the nanostructured bulk sample was investigated in the range of 300-450K. The presence of nanograins in the bulk sample exhibits a reduction of thermal conductivity and less effect on electrical conductivity. As a result, a figure of merit of the sintered bulk sample reached 0.2 at 400 K. A maximum micro Vickers hardness of 102 Hv was obtained for the nanostructured sample, which was higher than the other reported results.

BIO-PIXE AND BIO-SXRF

1996 ◽  
Vol 06 (01n02) ◽  
pp. 367-373
Author(s):  
HUIYING YAO ◽  
CHENGZHI JIN ◽  
JINGXIA ZHANG ◽  
BENJIE WU
Keyword(s):  
Quantitative Analysis ◽  
Synchrotron Radiation ◽  
Chemical State ◽  
Excitation Source ◽  
Powerful Method ◽  
State Information ◽  
X Ray ◽  
Detectable Limit ◽  
Accurate Quantitative Analysis ◽  
Biological Field

Application of PiXE On biology, medicine and environment has been successful in the last twenty years. However, with the development of science and technique, lower detectable limit, sub-ppm sensitivity, more accurate quantitative analysis and the element chemical state information were presented which can not be achieved by PIXE. The synchrotron radiation as an excitation source to induce X-ray emission (SXRF) is a very powerful method with all the above requirements. In this paper the advantages of SXRF were discussed and compared with PIXE. The article shows our work on biological field by PIXE and SXRF also.

Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence

1983 ◽  
Vol 16 (6) ◽  
pp. 606-610 ◽  
Author(s):  
S. Weissmann ◽  
V. A. Greenhut ◽  
J. Chaudhuri ◽  
Z. H. Kalman
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Quantitative Analysis ◽  
Strain Distribution ◽  
Elastic Strain ◽  
Metal Film ◽  
Silicon Plate ◽  
X Ray ◽  
Scanning Electron

A method is presented for enhancing the fluorescence of the silver precipitates in the microfluorescent analysis of X-ray topographs by scanning electron microscopy or similar electron microprobes. The method is based on the indirect excitation of the silver fluorescence by depositing a thin suitable metal film on the emulsion of a nuclear track plate. Theoretical aspects of the method are presented and experimentally verified. The method was applied to determine the elastic strain distribution in a bent silicon plate containing a hole by measuring the opacities of the exposed and developed topograph obtained from the specimen.

scholarly journals Practical Issues for Quantitative X-ray Microanalysis in SEM at Low kV

2006 ◽  
Vol 14 (1) ◽  
pp. 30-33 ◽  
Author(s):  
Peter Statham
Keyword(s):  
Quantitative Analysis ◽  
Atomic Number ◽  
Beam Current ◽  
Research Groups ◽  
X Ray ◽  
Time Scanning ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

In the three decades following Castaing's seminal thesis [1] x-ray analysis received widespread attention from research groups. By 1980, the methods and correction procedures for quantitative analysis of elements with atomic number 11 and above, using accelerating voltages between 15kV and 25kV, were well established and available in commercial instrumentation. At the time, scanning electron microscopes (SEMs) could rarely deliver high and stable beam current at much lower kV, and x-ray spectrometers had poor efficiency below lkeV so that low kV analysis received comparatively little attention.

X-ray microanalysis and scanning electron microscopy of human alveolar macrophages

1988 ◽  
Vol 63 (S1) ◽  
pp. 5-5a
Author(s):  
Hélène Deveze-Cau ◽  
Pierre Cau ◽  
Micheline Saadjian ◽  
Marc Passerel ◽  
Alain Arnaud
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Alveolar Macrophages ◽  
X Ray ◽  
Human Alveolar Macrophages ◽  
Scanning Electron

Advances in Fundamental-Parameter Methods for Quantitative XRFA

1986 ◽  
Vol 30 ◽  
pp. 97-104 ◽  
Author(s):  
Michael Mantler
Keyword(s):  
Quantitative Analysis ◽  
Single Layer ◽  
Precise Determination ◽  
Emission Lines ◽  
Fundamental Parameter ◽  
X Ray ◽  
Accurate Quantitative Analysis ◽  
Intensity Ratios ◽  
Specimen Shape

The fundamental-parameter technique is an important tool for quantitative x-ray chemical analysis and is routinely applied for the quantification of bulk specimens and single layer films. A method extending it to multiple film layers has recently been introduced by Mantler and results from such applications have been reported by Huang and Parrish. In addition, fundamental-parameter methods can be employed to predict intensity ratios of fluorescent lines as well as the spectral distribution of radiation scattered by the specimen (shape of the background in the vicinity of emission, lines). This is useful for accurate quantitative analysis in the case of a poor peak-to-background ratio, where the precise determination of net intensities is difficult.

FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis without a Set of Similar Standards

1982 ◽  
Vol 26 ◽  
pp. 355-368 ◽  
Author(s):  
D. A. Gedcke ◽  
L. G. Byars ◽  
N. C. Jacobus
Keyword(s):  
Quantitative Analysis ◽  
Chemical Analysis ◽  
Sample Analysis ◽  
X Ray ◽  
Fundamental Parameters ◽  
Unknown Sample ◽  
Edxrf Analysis ◽  
Accurate Quantitative Analysis ◽  
Complete Chemical Analysis ◽  
Repetitive Analysis

The x-ray fluorescence (XRF) method is well known for its capability to perform fast and accurate quantitative analysis for all elements with atomic numbers greater than ten. Energy dispersive x-ray fluorescence (EDXRF) adds to this capability the benefit of quick qualitative analysis, due to its simultaneous sensitivity to all the elements. The method has the potential for rapid and complete chemical analysis of any sample which arrives on the analytical chemist's doorstep. Although the method has been a productive tool for fast and accurate repetitive analysis of similar samples, its applicability to unique unknowns has been rather limited. The limitation arises from the usual need to calibrate the instrument's response with a set of 6 to 12 standards, whose compositions must be similar to the unknown sample. Anyone who has struggled to develop and maintain such a suite of accurately certified standards knows that a great deal of effort and expense is involved. This effort is well justified when the analyst expects to analyze the same type of material frequently over an extended tine period. However, for a unique sample analysis, the task of developing a suite of similar standards simply makes the analysis impractical. What is needed is a method that requires minimal standards, or uses no standards at all.

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