An Application of Laser Measurement to On-Line Metal Strip Flatness Measurement

2020 ◽  
pp. 835-842
Author(s):  
Marcos Alonso ◽  
Alberto Izaguirre ◽  
Imanol Andonegui ◽  
Manuel Graña
Keyword(s):  
Metal Strip ◽  
Laser Measurement ◽  
Strip Flatness ◽  
On Line ◽  
Flatness Measurement

Research in Shape Meter Roll Deflection Compensation Model

2010 ◽  
Vol 146-147 ◽  
pp. 793-797 ◽  
Author(s):  
Jia Wei Liu ◽  
Dian Hua Zhang ◽  
Peng Fei Wang
Keyword(s):  
Measurement System ◽  
Influence Function ◽  
Function Method ◽  
Compensation Model ◽  
Strip Flatness ◽  
Influence Function Method ◽  
Measuring Signal ◽  
Flatness Measurement

In flatness measurement system, the flatness measuring signal can be affected by the flatness roll deflection. The flatness roll stress was analyzed and the flatness roll deflection model was obtained by using the influence function method in this paper. The model has been developed based on the deformation of flatness roll in rolling and compensating curve has been obtained. The results indicated that the setting curve of flatness is preferably accordant with the curve of online measuring flatness, and good strip flatness can be obtained.

Adaptive task-space metal strip-flatness control in cold multi-roll mill stands

2013 ◽  
Vol 23 (2) ◽  
pp. 108-119 ◽  
Author(s):  
G. Pin ◽  
V. Francesconi ◽  
F.A. Cuzzola ◽  
T. Parisini
Keyword(s):  
Metal Strip ◽  
Task Space ◽  
Strip Flatness ◽  
Roll Mill ◽  
Flatness Control

The development of a fast and robust computer model for metal rolling

2003 ◽  
Vol 217 (2) ◽  
pp. 169-179 ◽  
Author(s):  
A E Dixon ◽  
W Y D Yuen
Keyword(s):  
Plastic Deformation ◽  
Solution Method ◽  
Pressure Profile ◽  
Metal Strip ◽  
Roll Force ◽  
Numerical Solution Method ◽  
Circular Arc ◽  
Roll Flattening ◽  
On Line ◽  
Roll Gap

A combined analytical/numerical solution method is developed to solve the equations that describe stresses in the plastic deformation of metal strip during rolling together with the resultant roll flattening. This gives a model that is more robust and computationally faster for the same accuracy than standard numerical schemes. Initially, the model assumes the elastically deformed rolls to be approximated by a circular arc profile when in contact with the strip, but it is later extended to calculate the deformed roll profile from the pressure profile through the roll gap. Both versions are suitable for on-line use in predicting the necessary roll force for the rolling of metal strip to a given thickness reduction.

scholarly journals On-Line Flatness Measurement in the Steelmaking Industry

Sensors ◽  
2013 ◽  
Vol 13 (8) ◽  
pp. 10245-10272 ◽  
Author(s):  
Julio Molleda ◽  
Rubén Usamentiaga ◽  
Daniel García
Keyword(s):  
On Line ◽  
Flatness Measurement

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Design and calibration of an IVEM for general 3-dimensional imaging of non-diffracting materials

1992 ◽  
Vol 50 (2) ◽  
pp. 1040-1041
Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  
Keyword(s):  
3D Imaging ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
3 Dimensional ◽  
3D Microstructure ◽  
Image Translation ◽  
Digital Correlation ◽  
On Line ◽  
Mechanical Stage ◽  
Projection Angle

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).

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