Experimental Study of Frequency Modulation in Single-Frequency Lasers

Author(s):  
Philipp V. Skliarov ◽  
Konstantin V. Muravyov ◽  
Aleksei O. Kostromitin
Author(s):  
Gaurav Chawla ◽  
Santiago D. Solares

The ability of atomic force microscopy (AFM) to acquire tip-sample interaction force curves has allowed researchers to understand the mechanical behavior of numerous materials at the nanoscale. However, AFM force spectroscopy with the most commonly used techniques can be a slow process for non-uniform samples, as it often requires the measurement to be performed at one fixed surface point at a time. In this paper we present two dynamic AFM based spectroscopy methods, one requiring operation in single-frequency-modulation mode and another using dual-frequency-modulation, which could allow a more rapid acquisition of topography and tip-sample interaction force curves. Numerical simulation results are provided along with discussions on the benefits and limitations of both.


Author(s):  
Tiexin Liu ◽  
Wen Xu ◽  
W.X Chen ◽  
J.Y Dai ◽  
Y Zhang ◽  
...  

2021 ◽  
Author(s):  
yunfeng Li ◽  
Yunpeng Gao ◽  
Yinghui Feng ◽  
Yijia Cao ◽  
Yanqing Zhu

<a></a>It is difficult to measure voltage flicker parameter accurately and in real time under a complex power grid environment, a voltage flicker envelope extraction algorithm based on multi-point differential improved analytic energy operator (IAEO) is proposed, which simplified formula for extracting flicker envelope and a novel K-B optimal mutual convolution window function is constructed. Then, the correction formula of flicker amplitude and frequency is derived based on the three-spectral line interpolation of the novel K-B optimized mutual convolution window, and the estimation algorithm of voltage flicker parameter is proposed based on the IAEO and the novel K-B mutual convolution window. Finally, a voltage-flicker-parameter-estimation platform based on virtual instrument is developed. The simulation and experimental results show that the proposed algorithm can effectively measure voltage flicker parameter under single frequency modulation, multi-frequency modulation and fundamental frequency fluctuation. In addition, it can effectively overcome harmonics, interharmonics and noise interference. Compared with the existing estimation algorithm, the flicker envelope extraction is simpler, the measurement result is more accurate, and it is easy to implement embedded.<br>


2015 ◽  
Vol 21 (1) ◽  
pp. 81-85
Author(s):  
向少山 XIANG Shao-shan ◽  
张一弛 ZHANG Yi-chi ◽  
曹书凯 CAO Shu-kai ◽  
汪丽蓉 WANG Li-rong

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