Computational Development of Single- and Dual-Frequency Modulation Atomic Force Spectroscopy for Ambient Air Applications
The ability of atomic force microscopy (AFM) to acquire tip-sample interaction force curves has allowed researchers to understand the mechanical behavior of numerous materials at the nanoscale. However, AFM force spectroscopy with the most commonly used techniques can be a slow process for non-uniform samples, as it often requires the measurement to be performed at one fixed surface point at a time. In this paper we present two dynamic AFM based spectroscopy methods, one requiring operation in single-frequency-modulation mode and another using dual-frequency-modulation, which could allow a more rapid acquisition of topography and tip-sample interaction force curves. Numerical simulation results are provided along with discussions on the benefits and limitations of both.