Standing-Wave and Resonant Soft- and Hard-X-ray Photoelectron Spectroscopy of Oxide Interfaces

2018 ◽  
pp. 153-179 ◽  
Author(s):  
Slavomír Nemšák ◽  
Alexander X. Gray ◽  
Charles S. Fadley
Keyword(s):  
Standing Wave ◽  
Photoelectron Spectroscopy ◽  
Oxide Interfaces ◽  
X Ray

scholarly journals Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy

2022 ◽  
Vol 40 (2) ◽  
pp. 020801
Author(s):  
Cheng-Tai Kuo ◽  
Giuseppina Conti ◽  
Julien E. Rault ◽  
Claus M. Schneider ◽  
Slavomír Nemšák ◽  
...  
Keyword(s):  
Standing Wave ◽  
Photoelectron Spectroscopy ◽  
Oxide Interfaces ◽  
Emergent Phenomena

Surface Photovoltage Spectroscopy for the Investigation of Perovskite Oxide Interfaces

2005 ◽  
Vol 902 ◽  
Author(s):  
Elke Beyreuther ◽  
Stefan Grafström ◽  
Christian Thiele ◽  
Kathrin Dörr ◽  
Lukas M. Eng
Keyword(s):  
Photoelectron Spectroscopy ◽  
Perovskite Oxide ◽  
Surface Photovoltage ◽  
Epitaxial Thin Films ◽  
Trap States ◽  
Oxide Interfaces ◽  
X Ray ◽  
Surface Photovoltage Spectroscopy ◽  
Prepared State ◽  
Capacitive Method

AbstractIn the present study, we comparatively investigate the distribution of electronic interface states of three different perovskite oxide interfaces, formed by epitaxial thin films of La0.7Sr0.3MnO3 (LSMO), La0.7Ca0.3MnO3 (LCMO), and La0.7Ce0.3MnO3 (LCeMO) on SrTiO3(100) substrates, in the as-prepared state as well as after an annealing procedure. We find that annealing significantly reduces the number and density of interface trap states. Two different experimental realizations of the surface photovoltage spectroscopy (SPS) technique were employed: an approach based on X-ray photoelectron spectroscopy (XPS), as well as a capacitive method. The advantages and limitations of both methods are critically discussed.

Sign in / Sign up

Export Citation Format

Share Document