Surface Photovoltage Spectroscopy for the Investigation of Perovskite Oxide Interfaces
Keyword(s):
X Ray
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AbstractIn the present study, we comparatively investigate the distribution of electronic interface states of three different perovskite oxide interfaces, formed by epitaxial thin films of La0.7Sr0.3MnO3 (LSMO), La0.7Ca0.3MnO3 (LCMO), and La0.7Ce0.3MnO3 (LCeMO) on SrTiO3(100) substrates, in the as-prepared state as well as after an annealing procedure. We find that annealing significantly reduces the number and density of interface trap states. Two different experimental realizations of the surface photovoltage spectroscopy (SPS) technique were employed: an approach based on X-ray photoelectron spectroscopy (XPS), as well as a capacitive method. The advantages and limitations of both methods are critically discussed.
2012 ◽
Vol 610-613
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pp. 319-322
2014 ◽
Vol 141
(4)
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pp. 044718
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2008 ◽
Vol 8
(3)
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pp. 1266-1271
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2017 ◽
Vol 112
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pp. 249-256
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1999 ◽
Vol 14
(6)
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pp. 2381-2384
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2012 ◽
Vol 178-181
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pp. 645-648
2013 ◽
Vol 275-277
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pp. 2010-2013
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