Surface Characterization of Thin Organic Films on Metals

1985 ◽  
pp. 1-28
Author(s):  
D. M. Hercules
Keyword(s):  
Surface Characterization ◽  
Organic Films ◽  
Thin Organic Films

Infrared ellipsometry characterization of conducting thin organic films

2004 ◽  
Vol 455-456 ◽  
pp. 295-300 ◽  
Author(s):  
M. Schubert ◽  
C. Bundesmann ◽  
G. Jakopic ◽  
H. Maresch ◽  
H. Arwin ◽  
...  
Keyword(s):  
Organic Films ◽  
Infrared Ellipsometry ◽  
Thin Organic Films

Characterization of Thin Organic Films with Surface-Sensitive FTIR Spectroscopy

2014 ◽  
pp. 305-324
Author(s):  
Katy Roodenko ◽  
Damien Aureau ◽  
Florent Yang ◽  
Peter Thissen ◽  
Jörg Rappich
Keyword(s):  
Ftir Spectroscopy ◽  
Organic Films ◽  
Thin Organic Films

Challenges in the structural characterization of thin organic films

1991 ◽  
Vol 103 (1-2) ◽  
pp. 3-35 ◽  
Author(s):  
Paul W. Bohn ◽  
Dennis J. Walls
Keyword(s):  
Structural Characterization ◽  
Organic Films ◽  
Thin Organic Films

Characterization of biofunctional thin films deposited by activated vapor silanization

2008 ◽  
Vol 23 (7) ◽  
pp. 1931-1939 ◽  
Author(s):  
María Arroyo-Hernández ◽  
José Pérez-Rigueiro ◽  
Ana Conde ◽  
Aurelio Climent ◽  
Raul Gago ◽  
...  
Keyword(s):  
High Surface ◽  
Chemical Characterization ◽  
Chemical Vapor ◽  
Surface Concentration ◽  
Oxidation States ◽  
Secondary Amines ◽  
Organic Films ◽  
Silicon Substrates ◽  
Thin Organic Films

A novel technique based in the combination of vapor silanization and chemical vapor deposition, hereafter referred to as activated vapor silanization (AVS), is shown to be an effective biofunctionalization technique. The AVS process results in thin organic films with a high surface amine concentration when deposited on substrates with different chemical characteristics, such as silicon, porous silicon, or gold. Chemical characterization shows that the films are composed of carbon (hydrocarbon, C–Si, C–C), silicon (different oxidation states), nitrogen (primary and secondary amines), oxygen, and hydrogen. Relevantly, the amines are also distributed along the film thickness, ensuring functionality even after some degradation of the films. AVS films behave practically as monocrystalline silicon substrates under loading–unloading tests. In addition, the AVS films behave as permeable membranes for molecules smaller than 5 Å, and the amine surface concentration is estimated to be 8 NH2/nm2 for molecules of about 12 Å, which is three times higher than that obtained with standard silanization procedures.

Characterization of Thin Organic Films with Surface-Sensitive FTIR Spectroscopy

2018 ◽  
pp. 483-503
Author(s):  
Katy Roodenko ◽  
Damien Aureau ◽  
Florent Yang ◽  
Peter Thissen ◽  
Jörg Rappich
Keyword(s):  
Ftir Spectroscopy ◽  
Organic Films ◽  
Thin Organic Films

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Order in Thin Organic Films

1995 ◽  
Vol 189 (Part_2) ◽  
pp. 276-276
Author(s):  
H.-D. Dörfler
Keyword(s):  
Organic Films ◽  
Thin Organic Films
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