Characteristic Line Method for Limit Analysis

Author(s):  
Chuanzhi Huang
2012 ◽  
Vol 251 ◽  
pp. 252-256
Author(s):  
Hui Zhang

This paper researches on the data acquisition method in reverse engineering based on coordinate measuring machine. Firstly, it puts forward the data acquisition method of characteristic line based on the principle of path planning, then, it summarized the application scope of characteristic-line method by analyzing the examples of data acquisition of regular surface and free curved surface products, finally, it realizes the rapid data acquisition of product based on coordinate measuring machine.


Author(s):  
John J. Donovan ◽  
Donald A. Snyder ◽  
Mark L. Rivers

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:


2012 ◽  
Vol 18 (11) ◽  
pp. 1311-1318
Author(s):  
Hosoon Choi ◽  
Sung-Gul Hong ◽  
Young Hak Lee ◽  
Heecheul Kim ◽  
Dae-Jin Kim

2013 ◽  
Vol 57 ◽  
pp. 89-98 ◽  
Author(s):  
Piotr Aliawdin ◽  
Krystyna Urbańska

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