A Novel Duplication-Based Countermeasure to Statistical Ineffective Fault Analysis

2022 ◽  
pp. 255-275
Author(s):  
Anubhab Baksi
Keyword(s):  
Fault Analysis

Fault Analysis of A Five-Phase Induction Motor Drive

2008 ◽  
Vol 1 (3) ◽  
pp. 36-44
Author(s):  
M. Rizwan Khan ◽  
Atif Iqbal ◽  
Mukhtar Ahmad
Keyword(s):  
Induction Motor ◽  
Fault Analysis ◽  
Motor Drive ◽  
Induction Motor Drive

Failure Analysis of Short Faults on Advanced Wire-Bond and Flip-Chip Packages with Scanning SQUID Microscopy

2004 ◽  
Author(s):  
Steve K. Hsiung ◽  
Kevan V. Tan ◽  
Andrew J. Komrowski ◽  
Daniel J. D. Sullivan ◽  
Jan Gaudestad
Keyword(s):  
Magnetic Fields ◽  
Integrated Circuits ◽  
Quantum Interference ◽  
Flip Chip ◽  
Infrared Emission ◽  
Fault Analysis ◽  
Wire Bond ◽  
Overlay Design ◽  
Scanning Squid ◽  
Metal Layers

Abstract Scanning SQUID (Superconducting Quantum Interference Device) Microscopy, known as SSM, is a non-destructive technique that detects magnetic fields in Integrated Circuits (IC). The magnetic field, when converted to current density via Fast Fourier Transform (FFT), is particularly useful to detect shorts and high resistance (HR) defects. A short between two wires or layers will cause the current to diverge from the path the designer intended. An analyst can see where the current is not matching the design, thereby easily localizing the fault. Many defects occur between or under metal layers that make it impossible using visible light or infrared emission detecting equipment to locate the defect. SSM is the only tool that can detect signals from defects under metal layers, since magnetic fields are not affected by them. New analysis software makes it possible for the analyst to overlay design layouts, such as CAD Knights, directly onto the current paths found by the SSM. In this paper, we present four case studies where SSM successfully localized short faults in advanced wire-bond and flip-chip packages after other fault analysis methods failed to locate the defects.

Carbon Coating for Electron Beam Testing and Focus Ion Beam Reconfiguration

1996 ◽  
Author(s):  
P. Perdu ◽  
G. Perez ◽  
M. Dupire ◽  
B. Benteo
Keyword(s):  
Electron Beam ◽  
Sample Preparation ◽  
Carbon Coating ◽  
Focused Ion Beam ◽  
Sacrificial Layer ◽  
Ion Beam ◽  
Electrical Characterization ◽  
Fault Analysis ◽  
Voltage Contrast ◽  
The Right

Abstract To debug ASIC we likely use accurate tools such as an electron beam tester (Ebeam tester) and a Focused Ion Beam (FIB). Interactions between ions or electrons and the target device build charge up on its upper glassivation layer. This charge up could trigger several problems. With Ebeam testing, it sharply decreases voltage contrast during Image Fault Analysis and hide static voltage contrast. During ASIC reconfiguration with FIB, it could induce damages in the glassivation layer. Sample preparation is getting a key issue and we show how we can deal with it by optimizing carbon coating of the devices. Coating is done by an evaporator. For focused ion beam reconfiguration, we need a very thick coating. Otherwise the coating could be sputtered away due to imaging. This coating is use either to avoid charge-up on glassivated devices or as a sacrificial layer to avoid short circuits on unglassivated devices. For electron beam Testing, we need a very thin coating, we are now using an electrical characterization method with an insitu control system to obtain the right thin thickness. Carbon coating is a very cheap and useful method for sample preparation. It needs to be tuned according to the tool used.

Fault Analysis of Grid Connected MPPT Based Photovoltaic System

2018 ◽  
Author(s):  
VK. Srivastava ◽  
Lakhan Singh ◽  
Sunil Singh
Keyword(s):  
Fault Analysis ◽  
Photovoltaic System

scholarly journals Dynamic grid fault analysis in wind power plant with DFIG by using supervisory control and data acquisition (SCADA) viewer

2020 ◽  
Vol 181 ◽  
pp. 03006
Author(s):  
Nduwamungu Aphrodis ◽  
Ntagwirumugara Etienne ◽  
Utetiwabo Wellars ◽  
Mulolani Francis
Keyword(s):  
Power Systems ◽  
Power Flow ◽  
Control Strategies ◽  
Electrical Power ◽  
Fault Analysis ◽  
Operational Mode ◽  
Electrical Power Systems ◽  
Fault Ride Through ◽  
Before And After ◽  
Clearing Time

Faults in electrical power systems are among the key factors and sources to network disturbances, however control strategies are among key faults clearing techniques for the sake of safe operational mode of the system.Some researchers have shown various limitations of control strategies such as slow dynamic response,inability to switch Off and On network remotely and fault clearing time. For a system with wind energy technologies, if the power flow of a wind turbine is interrupted by a fault, the intermediate-circuit voltage between the machine-side converter and line-side converter will fall in unacceptably high values.To overcome the aforementioned issues, this paper used a Matlab simulations and experiments in order to analyze and validate the results.The results showed that fault ride through (FRT) with SCADA Viewer software are more adaptable to the variations of voltage and wind speed in order to avoid loss of synchronism. Therefore at the speed of 12.5m/s a wind produced a rated power of 750W and remained in synchronization before and after a fault created and cleared but worked as generator meanwhile at speed of 3.4m/s wind disconnected from grid and started working as a motor and consumed active power (P=-25watts) and voltage dip at 100% .For the protection purpose, the DC chopper and crowbar should be integrated towards management of excess energy during faults cases.

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