Atomic force microscopy in a liquid and in situ ellipsometry as complementary techniques for the study of protein adsorption

2004 ◽  
pp. 63-67
Author(s):  
A. T. Almeida ◽  
H. Gliemann ◽  
T. Schimmel ◽  
D. F. S. Petri
Keyword(s):  
Atomic Force Microscopy ◽  
Protein Adsorption ◽  
Force Microscopy ◽  
Atomic Force ◽  
Complementary Techniques

scholarly journals Review—Multiscale Characterization of Li-Ion Batteries through the Combined Use of Atomic Force Microscopy and X-ray Microscopy and Considerations for a Correlative Analysis of the Reviewed Data

2021 ◽  
Author(s):  
Danilo Dini ◽  
Flavio Cognigni ◽  
Daniele Passeri ◽  
Francesca Anna Scaramuzzo ◽  
Mauro Pasquali ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Correlative Analysis ◽  
Atomic Force ◽  
Combined Use ◽  
Complementary Techniques ◽  
Non Destructive

Abstract The present review analyses the recent literature on the combined use of X-ray microscopy (XRM) and atomic force microscopy (AFM) for multiscale characterization of Li+ (or Li) batteries (LiBs) with the aim of developing guidelines for correlative analysis. The usefulness of XRM resides in the capability of affording non invasively in situ images of the inner parts of a LiB (an encapsulated device) with spatial resolution of dozens of nm during operation. XRM is non destructive and affords the early diagnosis of LiBs degradation causes when these manifest themselves as microdeformations. Multiscale characterization of LiBs also requires AFM for visualizing the morphological/physical alterations of LiB components (anodes, cathodes, electrolyte) at the sub-nanometer level. Different to XRM, AFM necessitates of a modification of LiB working configuration since AFM uses a contacting probe whereas XRM exploits radiation-matter interactions and does not require LiB dissection. A description of the working principles of the two techniques is provided to evidence which technical aspects have to be considered for achieving a meaningful correlative analysis of LiBs. In delineating new perspectives for the analysis of LiBs we will consider additional complementary techniques. Among various AFM-based techniques particular emphasis is given to electrochemical AFM (EC-AFM).

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

In Situ Observation of Low‐Power Nano‐Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy

Small ◽  
2021 ◽  
pp. 2101100
Author(s):  
Fei Hui ◽  
Peisong Liu ◽  
Stephen A. Hodge ◽  
Tian Carey ◽  
Chao Wen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Low Power ◽  
In Situ Observation ◽  
Synaptic Response ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals In Situ Atomic Force Microscopy of the Reconfiguration of On‐Surface Self‐Assembled DNA‐Nanoparticle Superlattices

2019 ◽  
Vol 29 (10) ◽  
pp. 1806924 ◽  
Author(s):  
Mikhail Shekhirev ◽  
Eli Sutter ◽  
Peter Sutter
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Nanoparticle Superlattices

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

In situ atomic force microscopy observation of hydrogen absorption/desorption by Palladium thin film

2011 ◽  
Vol 258 (4) ◽  
pp. 1456-1459 ◽  
Author(s):  
Itoko Matsumoto ◽  
Kouji Sakaki ◽  
Yumiko Nakamura ◽  
Etsuo Akiba
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Hydrogen Absorption ◽  
Microscopy Observation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Observation

The evolution of growth modes and activity of growth sources on canavalin investigated by in situ atomic force microscopy

2000 ◽  
Vol 208 (1-4) ◽  
pp. 623-637 ◽  
Author(s):  
Terry A Land ◽  
James J De Yoreo
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Growth Modes
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