A combination of atomic force microscopy and secondary ion mass spectrometry for investigation of AlxGa1?xAs/GaAs superlattices
1993 ◽
Vol 345
(8-9)
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pp. 615-617
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1999 ◽
Vol 27
(7)
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pp. 659-669
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2011 ◽
Vol 258
(4)
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pp. 1322-1327
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2009 ◽
Vol 286
(1)
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pp. 11-16
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2001 ◽
Vol 64
(1)
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pp. 87-93
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2011 ◽
Vol 7
(3)
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pp. 265-270
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