Focusing properties of the electric field between charged conical surfaces

1981 ◽  
Vol 24 (10) ◽  
pp. 927-931
Author(s):  
I. Ya. Nikiforov ◽  
A. T. Kozakov ◽  
M. N. Rabinovich
Keyword(s):  
Electric Field ◽  
Conical Surfaces ◽  
Focusing Properties

Analysis of focusing properties of the edge electric field of the accelerating structure of the LUE-200 accelerator

2020 ◽  
pp. 26-30
Author(s):  
M.V. Arsentyeva ◽  
◽  
A.M. Barnyakov ◽  
A.E. Levichev ◽  
A.P. Sumbaev ◽  
...  
Keyword(s):  
Electric Field ◽  
Accelerating Structure ◽  
Focusing Properties

Analysis of Focusing Properties of the Edge Electric Field of the Accelerating Structure of the Lue-200 Accelerator

2020 ◽  
Vol 63 (7) ◽  
pp. 1133-1138
Author(s):  
M. V. Arsentyeva ◽  
A. M. Barnyakov ◽  
A. E. Levichev ◽  
A. P. Sumbaev
Keyword(s):  
Electric Field ◽  
Accelerating Structure ◽  
Focusing Properties

scholarly journals Focusing Properties of a Modified Retarding Structure for Linear Electron Accelerators

2017 ◽  
Vol 7 (2) ◽  
pp. 741
Author(s):  
Vladimir Kuz'mich Shilov ◽  
Aleksandr Nikolaevich Filatov ◽  
Aleksandr Evgen'evich Novozhilov
Keyword(s):  
Electric Field ◽  
Standing Wave ◽  
Radial Component ◽  
Wave Mode ◽  
Linear Electron ◽  
Focusing Effect ◽  
Electron Accelerators ◽  
Field Lines ◽  
Accelerated Particles ◽  
Focusing Properties

When using accelerators in industry and medicine, important are the dimensions of the device used, especially the radial ones. In the linear electron accelerators based on a biperiodic retarding structure, which operates in the standing wave mode, there is a possibility to provide focusing of the accelerated particles with the help of high-frequency fields without the use of external focusing elements. In the accelerating cell, due to the presence of the far protruding drift sleeves, the electric field lines become strongly curved, which leads to the appearance in the regions adjacent to these sleeves of a substantial in magnitude radial component of the electric field. The particles entering the accelerating gap experience the action of a force directed toward the axis of the system, and at the exit, of a force directed away from the axis. Under certain conditions, alternation of the focusing and defocusing fields can lead to a general focusing effect. In the paper we study the focusing properties of a modified biperiodic structure with standing wave. The main attention is paid to the possibility of using the focusing properties of the electromagnetic accelerating field for guiding the electron beam through the aperture of the accelerating system, which will lead to a significant reduction in the accelerator sizes. The proposed method can be applied in the calculation and design of linear electron accelerators.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

An improved magnetic prism design for a transmission electron microscope energy filter

1978 ◽  
Vol 36 (1) ◽  
pp. 40-41 ◽  
Author(s):  
John W. Andrew ◽  
F.P. Ottensmeyer ◽  
E. Martell
Keyword(s):  
Energy Resolution ◽  
Symmetry Plane ◽  
Fringe Field ◽  
Focal Distance ◽  
Electron Trajectories ◽  
Focusing Effect ◽  
Transmission Electron ◽  
Path Lengths ◽  
Electron Microscopes ◽  
Focusing Properties

Energy selecting electron microscopes of the Castaing-Henry prism-mirror-prism design suffer from a loss of image and energy resolution with increasing field of view. These effects can be qualitatively understood by examining the focusing properties of the prism shown in Fig. 1. A cone of electrons emerges from the entrance lens crossover A and impinges on the planar face of the prism. The task of the prism is to focus these electrons to a point B at a focal distance f2 from the side of the prism. Electrons traveling in the plane of the diagram (i.e., the symmetry plane of the prism) are focused toward point B due to the different path lengths of different electron trajectories in the triangularly shaped magnetic field. This is referred to as horizontal focusing; the better this focusing effect the better the energy resolution of the spectrometer. Electrons in a plane perpendicular to the diagram and containing the central ray of the incident cone are focused toward B by the curved fringe field of the prism.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

Linear growth of instabilities on a liquid metal under normal electric field

1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid
Keyword(s):  
Liquid Metal ◽  
Electric Field ◽  
Linear Growth ◽  
Normal Electric Field
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