Chemical and microscopic studies of the matrix substance in pigment glands of cotton (Gossypium hirsutum L.) seeds

1986 ◽  
Vol 63 (4) ◽  
pp. 534-537 ◽  
Author(s):  
Lawrence Yatsu ◽  
Thomas J. Jacks ◽  
Henry W. Kircher ◽  
Mary An Godshall
Keyword(s):  
Gossypium Hirsutum ◽  
Gossypium Hirsutum L ◽  
The Matrix ◽  
Microscopic Studies ◽  
Matrix Substance ◽  
Pigment Glands

scholarly journals Cytochemical localization of H2O2 in pigment glands of cotton (Gossypium hirsutum L.)

2016 ◽  
Vol 15 (7) ◽  
pp. 1490-1498
Author(s):  
Ling-li WANG ◽  
Shuang-shuang ZHENG ◽  
Pan-pan TONG ◽  
Yan CHEN ◽  
Wen-zhe LIU
Keyword(s):  
Gossypium Hirsutum ◽  
Gossypium Hirsutum L ◽  
Cytochemical Localization ◽  
Pigment Glands

Digital image processing methods applied to the study of annealing time on semiconductor-metal eutectic composites

1988 ◽  
Vol 46 ◽  
pp. 848-849
Author(s):  
J. Hefter
Keyword(s):  
Image Processing ◽  
Digital Image Processing ◽  
Digital Image ◽  
Electronic Device ◽  
Processing System ◽  
Average Diameter ◽  
Eutectic Solidification ◽  
Metal Silicide ◽  
The Matrix ◽  
Microscopic Studies

Semiconductor-metal composites, formed by the eutectic solidification of silicon and a metal silicide have been under investigation for some time for a number of electronic device applications. This composite system is comprised of a silicon matrix containing extended metal-silicide rod-shaped structures aligned in parallel throughout the material. The average diameter of such a rod in a typical system is about 1 μm. Thus, characterization of the rod morphology by electron microscope methods is necessitated.The types of morphometric information that may be obtained from such microscopic studies coupled with image processing are (i) the area fraction of rods in the matrix, (ii) the average rod diameter, (iii) an average circularity (roundness), and (iv) the number density (Nd;rods/cm2). To acquire electron images of these materials, a digital image processing system (Tracor Northern 5500/5600) attached to a JEOL JXA-840 analytical SEM has been used.

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