Experimental Planning for Rapid Determination Of Optimum Process Conditions

JOM ◽  
1955 ◽  
Vol 7 (7) ◽  
pp. 834-838
Author(s):  
W. A. Griffith
Keyword(s):  
Rapid Determination ◽  
Optimum Process ◽  
Process Conditions ◽  
Experimental Planning

Standard Simple of Tin Bronze for Casting Develepment

2014 ◽  
Vol 1004-1005 ◽  
pp. 1186-1192
Author(s):  
Yan Song Li ◽  
Da Wei Wang
Keyword(s):  
Reference Materials ◽  
Standard Sample ◽  
National Standard ◽  
Optimum Process ◽  
Process Conditions ◽  
National Reference ◽  
Data Analyses ◽  
Tin Bronze ◽  
Standard Values

The development of standard simple of tin bronze for casting is presented,design of composition, selection melting temperature 1150 °C, put into 0.2m3/kg argon gas, stirring with 100rpm for 1min, keeping temperature for 30min as the optimum process conditions, coarse and fine tests of homogeneity with data analyses, determination of standard values and standard deviation. The homogeneity and standard values of samples meet the national standard GB/T15000 and YS/T409-1998. The standard sample series has ratification as National Reference Materials (GSB 04-2707-2011) by National Technical Commission on Reference Materials.

Determination of optimum process conditions for the extraction and separation of zirconium and hafnium by solvent extraction

2008 ◽  
Vol 90 (2-4) ◽  
pp. 115-120 ◽  
Author(s):  
M. Taghizadeh ◽  
R. Ghasemzadeh ◽  
S.N Ashrafizadeh ◽  
K. Saberyan ◽  
M. Ghanadi Maragheh
Keyword(s):  
Solvent Extraction ◽  
Optimum Process ◽  
Process Conditions ◽  
Extraction And Separation

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

Methods for rapid determination of pecan (Carya illinoensis) seed viability

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu
Keyword(s):  
Rapid Determination ◽  
Seed Viability ◽  
Carya Illinoensis
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