New phases and chemical short range order in co-deposited CoFe thin films with bcc structure: an NMR study

1997 ◽  
Vol 103 (1) ◽  
pp. 5-12 ◽  
Author(s):  
M. Wojcik ◽  
J.P. Jay ◽  
P. Panissod ◽  
E. Jedryka ◽  
J. Dekoster ◽  
...  
Keyword(s):  
Thin Films ◽  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
Nmr Study ◽  
Bcc Structure

On `non-stoichiometric phases' in thin films of rare-earth oxides

1978 ◽  
Vol 34 (6) ◽  
pp. 1025-1027 ◽  
Author(s):  
M. Gasgnier ◽  
P. Caro
Keyword(s):  
Thin Films ◽  
Rare Earth ◽  
Long Range ◽  
Short Range ◽  
Short Range Order ◽  
Rare Earth Oxides ◽  
Range Order ◽  
Acta Cryst ◽  
The Rare Earth

Kaul & Saxena [Acta Cryst. (1977), A33, 992-996] have reported the existence of long-range and short-range order in a non-stoichiometric phase 'LnO x ' (Ln = rare earth). It is shown that the experiments they are describing are indeed the oxidation of the rare-earth hydride LnH2 into the rare-earth cubic C-type sesquioxide. The interpretation they give of their experiments is to be discarded entirely.

Short-range order inAB3binary alloy thin films

2006 ◽  
Vol 74 (20) ◽  
Author(s):  
I. Zasada ◽  
A. Sukiennicki ◽  
L. Wojtczak ◽  
F. L. Castillo Alvarado
Keyword(s):  
Thin Films ◽  
Short Range ◽  
Short Range Order ◽  
Range Order

29Si MAS-NMR Study of the Short-Range Order in Potassium Borosilicate Glasses

1995 ◽  
Vol 78 (4) ◽  
pp. 952-960 ◽  
Author(s):  
Steve W. Martin ◽  
Ajay Bhatnagar ◽  
Chitra Parameswar ◽  
Steve Feller ◽  
Joshua MacKenzie
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Mas Nmr ◽  
Range Order ◽  
Borosilicate Glasses ◽  
29Si Mas Nmr ◽  
Nmr Study

Detection of short range order in SiO2 thin-films by grazing-incidence wide and small-angle X-ray scattering

2016 ◽  
Vol 119 (15) ◽  
pp. 154103
Author(s):  
Kohki Nagata ◽  
Atsushi Ogura ◽  
Ichiro Hirosawa ◽  
Tomoyuki Suwa ◽  
Akinobu Teramoto ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Short Range ◽  
Short Range Order ◽  
Grazing Incidence ◽  
Range Order ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Short-range order in amorphous co-sputtered Ta-Al thin films

1986 ◽  
Vol 44 ◽  
pp. 860-861
Author(s):  
J.C. Barry ◽  
R.S. Timsit ◽  
D. Landheer
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electron Microscope ◽  
High Resolution ◽  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
Transmission Electron ◽  
Thin Film Resistors ◽  
Diffraction Patterns

Tantalum-aluminium thin films have assumed considerable technological importance since the discovery in the late 1960's that the films are useful in the fabrication of thin film resistors and capacitors. It is generally claimed that these films, when prepared by co-sputtering Ta and Al, are amorphous over a range of Ta concentrations extending approximately from 15 to 75 at%, and are crystalline beyond this range. Diffuse electron diffraction patterns and ‘mottle pattern’ transmission electron micrographs are typical characteristics of the amorphous phase. In this present study we have attempted to identify any atomic short range order in the amorphous Ta-Al films and to follow the changes in this order as the Ta concentration increases across the amorphous/crystalline transition. The co-sputtered Ta-Al films of ≈100A thickness were examined in a high resolution 4000EX electron microscope (top entry, ±15°(x,y) tilt, Cs = 1.0mm ) at 400kV.

Short range order at the amorphous TiO2–water interface probed by silicic acid adsorption and interfacial oligomerization: An ATR-IR and 29Si MAS-NMR study

2012 ◽  
Vol 368 (1) ◽  
pp. 447-455 ◽  
Author(s):  
Peter J. Swedlund ◽  
Yantao Song ◽  
Zoran D. Zujovic ◽  
Michél K. Nieuwoudt ◽  
Andreas Hermann ◽  
...  
Keyword(s):  
Silicic Acid ◽  
Short Range ◽  
Short Range Order ◽  
Mas Nmr ◽  
Range Order ◽  
Water Interface ◽  
29Si Mas Nmr ◽  
Nmr Study ◽  
Amorphous Tio2
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