Novel full range vacuum pressure sensing technique using free decay of trapezoid micro-cantilever beam deflected by electrostatic force

2012 ◽  
Vol 18 (11) ◽  
pp. 1903-1908 ◽  
Author(s):  
Yu-Ting Wang ◽  
Tien-Chen Hu ◽  
Chi-Jia Tong ◽  
Ming-Tzer Lin
2013 ◽  
Vol 300-301 ◽  
pp. 1309-1312
Author(s):  
Ji Long Su ◽  
Yan Jiao Zhang ◽  
Xing Feng Lian

The Ansys simulate software is utilized to analyze pull-in voltages and stresses of the fixed end of micro- cantilever beam with different thicknesses respectively. Based on the analysis of the electrostatic force at the pull-in voltage, the stress of fixed end of micro-beam and the maximum deflection are obtained. The relationship between the stress of fixed end and thickness is established. The results show that the mutation thickness of the stress and the pull-in voltage are at and respectively , it is consistent with the intrinsic size of the polycrystalline copper micro-beam.


2009 ◽  
Vol 3 (9) ◽  
Author(s):  
Othman Sidek ◽  
Muhamad Azman Miskam ◽  
H.M.T Khaleed ◽  
Mohd Fauzi Alias ◽  
Shukri Korakkottil Kunhi Mohd

2010 ◽  
Vol 37 (7) ◽  
pp. 1784-1788 ◽  
Author(s):  
张晓晶 Zhang Xiaojing ◽  
张博明 Zhang Boming ◽  
陈吉安 Chen Ji′an ◽  
武湛君 Wu Zhanjun

Author(s):  
Atabak Sarrafan ◽  
Seiyed Hamid Zareh ◽  
Abolghassem Zabihollah ◽  
Amir Ali Khayyat

Measurement ◽  
2011 ◽  
Vol 44 (2) ◽  
pp. 454-465 ◽  
Author(s):  
Alireza Shooshtari ◽  
Hamed Kalhori ◽  
Amirhasan Masoodian

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