A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients

Device-Physics-Based Analytical Model for Single-Event Transients in SOI CMOS Logic

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2009.2034004 ◽

2009 ◽

Vol 56 (6) ◽

pp. 3043-3049 ◽

Cited By ~ 19

Author(s):

Daisuke Kobayashi ◽

Kazuyuki Hirose ◽

VÉronique Ferlet-Cavrois ◽

Dale McMorrow ◽

Takahiro Makino ◽

...

Keyword(s):

Analytical Model ◽

Device Physics ◽

Single Event ◽

Single Event Transients ◽

Soi Cmos

An Analytical Model of Single-Event Transients in Double-Gate MOSFET for Circuit Simulation

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2926883 ◽

2019 ◽

Vol 66 (9) ◽

pp. 3710-3717 ◽

Author(s):

Y. M. Aneesh ◽

S. R. Sriram ◽

K. R. Pasupathy ◽

B. Bindu

Keyword(s):

Analytical Model ◽

Circuit Simulation ◽

Double Gate ◽

Single Event ◽

Single Event Transients ◽

Double Gate Mosfet

Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2021.3051802 ◽

2021 ◽

pp. 1-1

Author(s):

George N. Tzintzarov ◽

Adrian Ildefonso ◽

Jeffrey W. Teng ◽

Milad Frounchi ◽

Albert Djikeng ◽

...

Keyword(s):

Photon Absorption ◽

Single Event ◽

Two Photon Absorption ◽

Two Photon ◽

Single Event Transients ◽

Silicon Photonic ◽

Photonic Waveguides

4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) ◽

An Efficient Design of Single Event Transients Tolerance for Logic Circuits

10.1109/delta.2008.9 ◽

2008 ◽

Cited By ~ 4

Author(s):

Yantu Mo ◽

Suge Yue

Keyword(s):

Logic Circuits ◽

Single Event ◽

Efficient Design ◽

Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients

2020 IEEE International Test Conference (ITC) ◽

10.1109/itc44778.2020.9325252 ◽

2020 ◽

Author(s):

Rafael B. Schvittz ◽

Paulo F. Butzen ◽

Leomar S. da Rosa

Keyword(s):

Logic Gates ◽

Single Event ◽

Susceptibility Analysis ◽

On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs

Microelectronics Reliability ◽

10.1016/j.microrel.2018.07.135 ◽

2018 ◽

Vol 88-90 ◽

pp. 936-940 ◽

Author(s):

S. Azimi ◽

L. Sterpone ◽

B. Du ◽

L. Boragno

Keyword(s):

Single Event ◽

Single Event Transients ◽

Radiation Induced

A Detailed Characterization of Errors in Logic Circuits due to Single-Event Transients

2015 Euromicro Conference on Digital System Design ◽

10.1109/dsd.2015.58 ◽

2015 ◽

Author(s):

Nanditha P. Rao ◽

Madhav P. Desai

Keyword(s):

Logic Circuits ◽

Single Event ◽

Detailed Characterization ◽

Electric regime influence on the DC-DC converters’s hardness to single event transients

Russian Microelectronics ◽

10.1134/s1063739715010060 ◽

2015 ◽

Vol 44 (1) ◽

pp. 44-48 ◽

Cited By ~ 7

Author(s):

L. N. Kessarinskiy ◽

A. Y. Borisov ◽

D. V. Boychenko ◽

A. O. Akhmetov

Keyword(s):

Single Event ◽

Single Event Transients ◽

Electric Regime

A DC-to-8.5 GHz 32 : 1 Analog Multiplexer for On-Chip Continuous-Time Probing of Single-Event Transients in a 65-nm CMOS

IEEE Transactions on Circuits & Systems II Express Briefs ◽

10.1109/tcsii.2016.2567781 ◽

2017 ◽

Vol 64 (4) ◽

pp. 377-381 ◽

Author(s):

Mladen Mitrovic ◽

Michael Hofbauer ◽

Bernhard Goll ◽

Kerstin Schneider-Hornstein ◽

Robert Swoboda ◽

...

Keyword(s):

Continuous Time ◽

Single Event ◽

Single Event Transients ◽

On Chip ◽

Analog Multiplexer

2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) ◽

Reliability analysis of combinational circuits with the influences of noise and single-event transients

10.1109/dft.2013.6653609 ◽

2013 ◽

Author(s):

Kaikai Liu ◽

Hao Cai ◽

Ting An ◽

Lirida Naviner ◽

Jean-Francois Naviner ◽

...

Keyword(s):

Reliability Analysis ◽

Combinational Circuits ◽

Single Event ◽