Fabrication of two-dimensional zinc oxide nanorod patterns and their application for optical diffraction grating effect

2014 ◽  
Vol 49 (24) ◽  
pp. 8328-8334 ◽  
Author(s):  
Un Jeong Kim ◽  
Sun Il Kim ◽  
Sungwoo Hwang ◽  
Jaehyun Hur
1991 ◽  
Vol 239 ◽  
Author(s):  
J. Ruud ◽  
D. Josell ◽  
A. L. Greer ◽  
F. Spaepen

ABSTRACTA new design for a thin film microtensile tester is presented. The strain is measured directly on the free-standing thin film from the displacement of laser spots diffracted from a thin grating applied to its surface by photolithography. The diffraction grating is two-dimensional, allowing strain measurement both along and transverse to the tensile direction. In principle, both Young's modulus and Poisson's ratio of a thin film can be determined. Ag thin films with strong <111> texture were tested. The measured Young moduli agreed with those measured on bulk crystals, but the measured Poisson ratios were low, most likely due to slight transverse folding of the film that developed during the test.


Author(s):  
Naif H. Al-Hardan ◽  
Muhammad Azmi Abdul Hamid ◽  
Roslinda Shamsudin ◽  
Norinsan Kamil Othman
Keyword(s):  

2005 ◽  
Vol 295-296 ◽  
pp. 189-194 ◽  
Author(s):  
G.H. Wu ◽  
Z.J. Cai ◽  
Li Jiang Zeng

A two-color heterodyne interferometer based on the movement of the optical diffraction grating is proposed. The method allows us to measure the phase of synthetic wavelength f s directly and with high accuracy to extend the range of unambiguity for interferometric measurements by using two close wavelengths. Our experiment results show that the uncertainty in displacement measurement caused by the uncertainty in f s is 0.20 µm, smaller than the half of a single wavelength we used. The fringe order of a single wavelength can be determined without ambiguity. The uncertainty in displacement measurement can be improved further by using a single wavelength.


2010 ◽  
Vol 10 (3) ◽  
pp. 1928-1933 ◽  
Author(s):  
Ming Fu ◽  
Ji Zhou ◽  
Xueguang Huang ◽  
Dawei He ◽  
Yongsheng Wang

The correspondence between the X-ray diffraction pattern of a crystal and the optical diffraction pattern of a two-dimensional grating has been used to determine the nature of the diffraction from imperfect crystals. A two-dimensional grating representing the structure of the imperfect crystal is prepared on a very fine-grained photographic plate by a technique which gives an error of less than 1 μ in the positions of the elements of the grating. The grating is placed in a bath of cedar-wood oil between optically flat glass plates, and its Fraunhofer diffraction pattern is observed in a modified Lipson diffractometer. Illustrations are given of the application of the optical method to the study of the diffraction from modulated structures, such as the alloy Cu 4 FeNi 3 with a periodic variation of lattice parameter, and the age-hardening aluminium-copper alloy with a variation of both lattice parameter and structure amplitude.


Sign in / Sign up

Export Citation Format

Share Document